Simulation of hot electron and quantum effects in AlGaN/GaN heterostructure field effect transistors

被引:64
作者
Braga, N [1 ]
Mickevicius, R
Gaska, R
Hu, X
Shur, MS
Khan, MA
Simin, G
Yang, J
机构
[1] Integrated Syst Engn Inc, San Jose, CA 95113 USA
[2] Sensor Elect Technol Inc, Columbia, SC 29209 USA
[3] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
[4] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
关键词
D O I
10.1063/1.1719262
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on simulations of electrical characteristics of AlGaN/(InGaN)/GaN heterostructure field effect transistors with quantum and hot electron effects taken into account. Polarization charges lead to quantum confinement of electrons in the channel and to the formation of two-dimensional electron gas. The electron quantization leads to the spread of the electron wave function into the barrier and bulk but does not have significant impact on dc electrical characteristics. Hot electrons play an important part in the charge transport by spilling over into the bulk GaN where they are captured by traps. This leads to negative differential conductivity, which is also observed experimentally. The simulation results are in good agreement with measured dc characteristics. (C) 2004 American Institute of Physics.
引用
收藏
页码:6409 / 6413
页数:5
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