Long-term transient and metastable effects in cadmium telluride photovoltaic modules

被引：28

作者：

del Cueto, J. A. ^{[1
]}

von Roedern, B. ^{[1
]}

机构：

[1] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

PROGRESS IN PHOTOVOLTAICS | 2006年 / 14卷 / 07期

关键词：

CdTe solar cells; photovoltaics; thin-film photovoltaics; stability; transients;

D O I：

10.1002/pip.687

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Thin-film cadmium telluride (CdTe) photovoltaic (PV) technology is poised to begin making significant contributions and impact on terrestrial, electric power generation. However, some outstanding issues such as stability and transient behavior, and their impact on reliability and assessment of performance, remain to be thoroughly addressed, which has prompted some unease among PV industry integrators toward deploying this technology. We explore the issues of long-term stability and transient behavior in the performance of CdTe modules herein, using data acquired from indoor light-soaking studies. We find that measurement of current-voltage parameters and their temperature coefficients are entangled with transient effects. Changes in module power depend on recent operating history, such as electrical bias, and can result in either artificially high or low performance. Both the open-circuit voltage (V-oc) and fill factor (FF) are significantly impacted by metastable behavior that appears to linger for up to tens of hours, and we observe such increased transient effects after modules have undergone several hundred hours of light exposure. We present and analyze data measured under standard reporting conditions and actual operating conditions for six CdTe modules light-exposed and stressed at 65 degrees C nominal temperatures. Copyright (C) 2006 John Wiley & Sons, Ltd.

引用

页码：615 / 628

页数：14

共 18 条

[1] Determination of Cu in CdTe/CdS devices before and after accelerated stress testing [J].

Asher, SE ;

Hasoon, FS ;

Gessert, TA ;

Young, MR ;

Sheldon, P ;

Hiltner, J ;

Sites, J .

CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000, 2000, :479-482

[2]

*ASTM, E103696 ASTM

[3] Consistent processing and long term stability of CdTe devices [J].

Barth, KL ;

Enzenroth, RA ;

Sampath, WS .

Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - 2005, 2005, :323-326

[4] Progress in Apollo® technology [J].

Cunningham, DW ;

Frederick, M ;

Gittings, B ;

Grammond, L ;

Harrer, S ;

Intagliata, J ;

O'Connor, N ;

Rubcich, M ;

Skinner, D ;

Veluchamy, P .

CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002, 2002, :559-562

[5] Evolution of CdS/CdTe device performance during Cu diffusion [J].

Gessert, TA ;

Smith, S ;

Moriatry, T ;

Young, M ;

Asher, S ;

Johnston, S ;

Duda, A ;

DeHart, C .

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005, 2005, :291-294

[6]

HAMMOND B, 2003, 3 NAT THIN FILM MOD

[7] Electron-beam induced degradation in CdTe photovoltaics [J].

Harju, R ;

Karpov, VG ;

Grecu, D ;

Dorer, G .

JOURNAL OF APPLIED PHYSICS, 2000, 88 (04) :1794-1801

[8] Transient degradation and recovery of CdS/CdTe solar cells [J].

Hegedus, S ;

Desai, D ;

Ryan, D ;

McCandless, B .

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005, 2005, :319-322

[9] CdTe contacts for CdTe/CdS solar cells: effect of Cu thickness, surface preparation and recontacting on device performance and stability [J].

Hegedus, SS ;

McCandless, BE .

SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2005, 88 (01) :75-95

[10] Thin-film solar cells: Device measurements and analysis [J].

Hegedus, SS ;

Shafarman, WN .

PROGRESS IN PHOTOVOLTAICS, 2004, 12 (2-3) :155-176

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