X-ray study of atomic correlations in Zn0.5Cd0.5Se0.5Te0.5 epitaxial thin films

被引：14

作者：

Lu, Q ^{[1
]}

Bunker, BA ^{[1
]}

Luo, H ^{[1
]}

Kropf, AJ ^{[1
]}

Kemner, KM ^{[1
]}

Furdyna, JK ^{[1
]}

机构：

[1] UNIV NOTRE DAME,DEPT PHYS,NOTRE DAME,IN 46556

来源：

PHYSICAL REVIEW B | 1997年 / 55卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.55.9910

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray absorption fine-structure spectroscopy (XAFS) measurements have been performed at approximately 90 K to study the local structure of II-VI quaternary alloy Zn0.5Cd0.5Se0.5Te0.5. Samples were grown by molecular beam epitaxy on (100) CaAs substrates, 4 degrees miscut rewards the (111)B direction with a ZnTe buffer layer. The XAFS data indicate that there are more Zn-Se and Cd-Te bonds in the alloy than expected for a random arrangement. The results imply the formation of high-strain local structure and indicate that electronic pairing energies dominate over strain energy. Theses results are similar to the earlier observation of interlayer switching in ZnTe/CdSe superlattices. The preference of Zn-Se and Cd-Te bonding also implies a tendency to spontaneously form a composition-modulated microstructure.

引用

页码：9910 / 9914

页数：5

共 22 条

[1] SELF-ORGANIZED FORMATION OF COMPOSITIONALLY MODULATED ZNSE1-XTEX SUPERLATTICES [J].