Time-resolved photoluminescence of erbium centers in amorphous hydrogenated silicon

被引:18
作者
Kamenev, BV
Timoshenko, VY [1 ]
Konstantinova, EA
Kudoyarova, VK
Terukov, EI
Kashkarov, PK
机构
[1] Moscow MV Lomonosov State Univ, Dept Phys, Moscow 119899, Russia
[2] RAS, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
关键词
D O I
10.1016/S0022-3093(02)00954-7
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A time-resolved photoluminescence (PL) technique is employed to study the mechanisms of excitation and deexcitation of Er3- ions in amorphous hydrogenated silicon (a-Si:H) at temperatures 5-300 K. The PL at 1.5 mum is found to arise within times shorter than a 100 ns after irradiation with a nanosecond laser pulse, indicating a fast energy transfer from the electronic excitation of a-Si:H to the Er3- ions. The PL transients exhibit a stretched exponential decay with mean lifetime ranging from 20 to 35 lis when the temperature decreases from 300 K down to 5 K. The experimental results support the model of defect-related excitation and de-excitation of the Er3- ions. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:668 / 672
页数:5
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