High energy operation of the Tokyo-electron beam ion trap/present status

被引：4

作者：

Kuramoto, H

Shimizu, H

Nakamura, N

Currell, FJ

Kato, D

Kinugawa, T

Tong, XM

Watanabe, H

Fukami, T

Li, YM

Ohtani, S

Sokell, EJ

Yamada, C

Hirayama, T

Motohashi, K

Tsurubuchi, S

Okazaki, K

Sakurai, M

Tarbutt, MR

Silver, JD

机构：

[1] JST, ICORP, Cold Trapped Ions Project, Tokyo 1820024, Japan

[2] Univ Electrocommun, Tokyo 1828585, Japan

[3] Gakushuin Univ, Toshima Ku, Tokyo 1718588, Japan

[4] Tokyo Univ Agr & Technol, Tokyo 1848588, Japan

[5] RIKEN, Inst Phys & Chem Res, Urawa, Saitama 3500106, Japan

[6] Kobe Univ, Kobe, Hyogo 6578501, Japan

[7] Univ Oxford, Oxford OX1 3PU, England

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 02期

关键词：

D O I：

10.1063/1.1150261

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have been investigated using visible and x-ray spectroscopy. The charge-state distributions of the extracted ions from the trap are shown for the different experimental conditions. Ionization cross sections are measured by observing the time dependence of the charge state evolution in the extracted ions. A brief introduction of the recent studies is given. (C) 2000 American Institute of Physics. [S0034-6748(00)52302-8].

引用

页码：687 / 689

页数：3

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