Electron paramagnetic resonance of erbium in bulk silicon carbide crystals

被引:12
作者
Baranov, PG
Ilyin, IV
Mokhov, EN
机构
[1] A.F. Ioffe Phys.-Technical Institute, 194021 St. Petersburg
基金
俄罗斯基础研究基金会;
关键词
semiconductors; point defects; electron paramagnetic resonance;
D O I
10.1016/S0038-1098(97)00161-0
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We report the first EPR observation of rare-earth impurities in erbium doped bulk 6H-SiC crystals, grown by the sublimation sandwich-method. Two lines for axial Er3+ centre with crystalline c-axis being the axis of the g tensor, which seem to arise from different lattice sites in 6H-SiC and three Er3+ centres with same nearly orthorhombic symmetries, attributed to different lattice sites have been observed. A direct identification of erbium ions has been established by the presence of hyperfine interaction with Er-167 nuclei. The principal g values of the axial and orthorhombic Er3+ centres were found. The average g values suggest that the parent cubic ground state may have Gamma(7) representation for both centres. Presumably, erbium substitute for silicon in a regular environment for axial centre. The orthorhombic Er3+ seems to include another defect at carbon position along with Er3+ ion at silicon site. The EPR spectrum of the excited state of Er3+ in 6H-SiC seems to be observed at higher temperature. The trace amounts of the other rare-earth elements, in particular Dy3+, had probably been present in EPR spectra. (C) 1997 Published by Elsevier Science Ltd.
引用
收藏
页码:291 / 295
页数:5
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