Transparent Conductive Two-Dimensional Titanium Carbide Epitaxial Thin Films

被引:1405
作者
Halim, Joseph [1 ,2 ,3 ]
Lukatskaya, Maria R. [1 ,2 ]
Cook, Kevin M. [1 ,2 ]
Lu, Jun [3 ]
Smith, Cole R. [1 ]
Naslund, Lars-Ake [3 ]
May, Steven J. [1 ]
Hultman, Lars [3 ]
Gogotsi, Yury [1 ,2 ]
Eklund, Per [3 ]
Barsoum, Michel W. [1 ,3 ]
机构
[1] Drexel Univ, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA
[2] Drexel Univ, AJ Drexel Nanomat Inst, Philadelphia, PA 19104 USA
[3] Linkoping Univ, Thin Film Phys Div, Dept Phys Chem & Biol IFM, SE-58183 Linkoping, Sweden
基金
瑞典研究理事会;
关键词
ELECTRONIC-PROPERTIES; WEAK-LOCALIZATION; INTERCALATION; MXENES; AMMONIA; GROWTH; ANODE; XPS;
D O I
10.1021/cm500641a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Since the discovery of graphene, the quest for two-dimensional (2D) materials has intensified greatly. Recently, a new family of 2D transition metal carbides and carbonitrides (MXenes) was discovered that is both conducting and hydrophilic, an uncommon combination. To date MXenes have been produced as powders, flakes, and colloidal solutions. Herein, we report on the fabrication of similar to 1 x 1 cm(2) Ti3C2 films by selective etching of Al, from sputter-deposited epitaxial Ti3AlC2 films, in aqueous HF or NH4HF2. Films that were about 19 nm thick, etched with NH4HF2, transmit similar to 90% of the light in the visible-to-infrared range and exhibit metallic conductivity down to similar to 100 K. Below 100 K, the films' resistivity increases with decreasing temperature and they exhibit negative magnetoresistance-both observations consistent with a weak localization phenomenon characteristic of many 2D defective solids. This advance opens the door for the use of MXenes in electronic, photonic, and sensing applications.
引用
收藏
页码:2374 / 2381
页数:8
相关论文
共 40 条
[1]  
Barsoum MW, 2013, MAX PHASES: PROPERTIES OF MACHINABLE TERNARY CARBIDES AND NITRIDES, P1, DOI 10.1002/9783527654581
[2]   QUANTITATIVE-ANALYSIS OF WEAK LOCALIZATION IN THIN MG FILMS BY MAGNETORESISTANCE MEASUREMENTS [J].
BERGMANN, G .
PHYSICAL REVIEW B, 1982, 25 (04) :2937-2939
[3]   WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].
BERGMANN, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58
[4]   EVIDENCE FOR AMMONIA OXIDATION AND THE IONIC NATURE OF AMMONIATED TITANIUM DISULFIDE [J].
BERNARD, L ;
MCKELVY, M ;
GLAUNSINGER, W ;
COLOMBET, P .
SOLID STATE IONICS, 1985, 15 (04) :301-310
[5]   Ultrahigh electron mobility in suspended graphene [J].
Bolotin, K. I. ;
Sikes, K. J. ;
Jiang, Z. ;
Klima, M. ;
Fudenberg, G. ;
Hone, J. ;
Kim, P. ;
Stormer, H. L. .
SOLID STATE COMMUNICATIONS, 2008, 146 (9-10) :351-355
[6]   XPS STUDY OF AN INTUMESCENT COATING APPLICATION TO THE AMMONIUM POLYPHOSPHATE PENTAERYTHRITOL FIRE-RETARDANT SYSTEM [J].
BOURBIGOT, S ;
LEBRAS, M ;
GENGEMBRE, L ;
DELOBEL, R .
APPLIED SURFACE SCIENCE, 1994, 81 (03) :299-307
[7]  
Ci L, 2010, NAT MATER, V9, P430, DOI [10.1038/nmat2711, 10.1038/NMAT2711]
[8]   ADSORPTION AND DECOMPOSITION OF AMMONIA ON W(100) - XPS AND UPS STUDIES [J].
EGAWA, C ;
NAITO, S ;
TAMARU, K .
SURFACE SCIENCE, 1983, 131 (01) :49-60
[9]   Magnetron sputtering of Ti3SiC2 thin films,from a compound target [J].
Eklund, P. ;
Beckers, M. ;
Frodelius, J. ;
Hogberg, H. ;
Hultman, L. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2007, 25 (05) :1381-1388
[10]   Growth of Ti3SiC2 thin films by elemental target magnetron sputtering [J].
Emmerlich, J ;
Högberg, H ;
Sasvári, S ;
Persson, POÅ ;
Hultman, L ;
Palmquist, JP ;
Jansson, U ;
Molina-Aldareguia, JM ;
Czigány, Z .
JOURNAL OF APPLIED PHYSICS, 2004, 96 (09) :4817-4826