Capillary-wave roughening of surface-induced layering in liquid gallium

被引：78

作者：

Regan, MJ

Pershan, PS

Magnussen, OM

Ocko, BM

Deutsch, M

Berman, LE

机构：

[1] HARVARD UNIV,DEPT PHYS,CAMBRIDGE,MA 02138

[2] BROOKHAVEN NATL LAB,DEPT PHYS,UPTON,NY 11973

[3] BAR ILAN UNIV,DEPT PHYS,IL-52100 RAMAT GAN,ISRAEL

[4] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 11973

来源：

PHYSICAL REVIEW B | 1996年 / 54卷 / 14期

关键词：

D O I：

10.1103/PhysRevB.54.9730

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The temperature dependence of surface-induced atomic layering in liquid gallium has been investigated with x-ray reflectivity. The prominent layering peak at q(z)=2.4 Angstrom(-1) decreases dramatically upon heating from 22 to 170 degrees C, but its width stays, unexpectedly, unchanged. The decrease is traced to the temperature dependence of capillary-wave induced surface roughness. The constant width indicates a temperature-independent layering decay length. The measured layering amplitudes are found to be significantly underestimated by existing theory and molecular simulations.

引用

页码：9730 / 9733

页数：4

共 22 条

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