Surface structures on cleaved silicon by scanning tunnelling microscopy

被引：7

作者：

Andrienko, I ^{[1
]}

Haneman, D ^{[1
]}

机构：

[1] Univ New S Wales, Sch Phys, Sydney, NSW 2052, Australia

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1999年 / 11卷 / 43期

关键词：

D O I：

10.1088/0953-8984/11/43/306

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Scanning tunnelling microscopy observations on cleaved Si surfaces in ultra-high vacuum have revealed several new features. These include much deeper measured valleys between the 2 x 1 rows, and occurrences of chain bridging. The higher resolution surface profile data are readily compatible with the three-bond scission model but are difficult to reconcile with a modified Pandey chain model. Several surface structures are possible.

引用

页码：8437 / 8444

页数：8

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