Counting graphene layers on glass via optical reflection microscopy

被引：86

作者：

Gaskell, P. E. ^{[1
]}

Skulason, H. S. ^{[1
]}

Rodenchuk, C. ^{[1
]}

Szkopek, T. ^{[1
]}

机构：

[1] McGill Univ, Dept Elect & Comp Engn, Montreal, PQ H3A 2A7, Canada

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 14期

基金：

加拿大自然科学与工程研究理事会;

关键词：

Fresnel diffraction; graphene; multilayers; optical microscopy; visible spectra; SPECTROSCOPY;

D O I：

10.1063/1.3115026

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show that optical reflection microscopy is a reliable method to simultaneously locate and count graphene layers deposited on bulk, transparent substrates such as soda-lime glass. The visible contrast in optical reflection versus graphene layer number is resolvable on bulk substrates. A simple Fresnel theory based on the universal optical conductance of graphene layers accurately models optical reflection images taken at a wavelength of 550 +/- 5 nm. We directly count one to nine layers of graphene using reflection microscopy.

引用

页数：3

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