Excitonic signature in gain and carrier induced change of refractive index spectra of (In,Al)GaN quantum well lasers

被引:22
作者
Schwarz, UT [1 ]
Sturm, E
Wegscheider, W
Kümmler, V
Lell, A
Härle, V
机构
[1] Univ Regensburg, Inst Angew & Expt Phys, D-93040 Regensburg, Germany
[2] OSRAM Opto Semicond GmbH, D-93049 Regensburg, Germany
关键词
D O I
10.1063/1.1789243
中图分类号
O59 [应用物理学];
学科分类号
摘要
The exciton is observed in (In,Al)GaN laser diodes as resonance in the optical gain spectra and in the spectra of the carrier induced change of the refractive index. The observed instability of the exciton with respect to the free electron-hole plasma with increasing carrier densities is accompanied by a blueshift of the exciton resonance due to the quantum confined Stark shift. The experiments confirm central points of many-body simulations of InGaN/GaN quantum wells. The exciton becomes unstable near threshold and so lasing occurs from the electron-hole plasma. (C) 2004 American Institute of Physics.
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页码:1475 / 1477
页数:3
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