Structural features of laser ablation particulate from Si target, as revealed by focused ion beam technology

被引:20
作者
Bleiner, D [1 ]
Gasser, P [1 ]
机构
[1] Swiss Fed Labs Mat Testing & Res, EMPA, CH-8600 Dubendorf, Switzerland
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2004年 / 79卷 / 4-6期
关键词
D O I
10.1007/s00339-004-2618-x
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Heterogeneity in laser-induced particle structures was investigated by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) of individual particles micro-machined using focused ion beam (FIB). The primary particle size distribution spanned over three orders of magnitude, i.e., in the range 10 nm-10 mum with few larger secondary objects. The particulate larger than 0.5 mum often resulted from particle-particle aggregation, mostly upon a spherical core, seldom in chain-like structures. The core of these fractal aggregates was found to be polycrystalline. The heterogeneity of the particles with respect to structure and chemistry is surely of importance for elemental analysis using laser ablation as sample introduction technique.
引用
收藏
页码:1019 / 1022
页数:4
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