MBE growth of Si-doped InAlAsSb layers lattice-matched with InAs

被引:18
作者
Kudo, M
Mishima, T
机构
[1] Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Tokyo 185, 1-280, Higashi-Koigakubo
关键词
two-dimensional electron gas; modulation-doped heterostructures; InAs channel; electron-supplying layer;
D O I
10.1016/S0022-0248(96)00935-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The two-dimensional electron gas concentration in InAs channel modulation-doped heterostructures can be controlled by using an In0.5Al0.5As0.56Sb0.44 quaternary alloy - doped with Si as a donor - as an electron-supplying layer. When lattice-matched with InAs, an electron concentration of more than 4 x 10(18) cm(-3) was obtained in the quaternary layer. The two-dimensional electron gas concentration of an undoped-In0.5Al0.5As0.56Sb0.44/undoped-heterostructure was 7 x 10(11)cm(-2) and that of a. Si-doped In0.5Al0.5As0.56Sb0.44/undoped-InAs heterostructure was 1.24 x 10(12) cm(-2). The electron mobility was Iom, though, due to the roughness of the heterointerface. If the interface can be made smooth: however, In0.5Al0.5As0.56Sb0.44 will be a useful material for forming the electron-supplying layer of InAs channel modulation-doped heterostructures.
引用
收藏
页码:844 / 848
页数:5
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