Characterization of phototransistor internal gain in metamorphic high-electron-mobility transistors

被引:98
作者
Kang, HS
Choi, CS
Choi, WY
Kim, DH
Seo, KS
机构
[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 120749, South Korea
[2] Seoul Natl Univ, Sch Elect Engn, Seoul 151742, South Korea
关键词
D O I
10.1063/1.1739278
中图分类号
O59 [应用物理学];
学科分类号
摘要
We characterize the phototransistor internal gain of metamorphic high-electron-mobility transistors (mHEMTs). When the mHEMT operates as a phototransistor, it has internal gain provided by the photovoltaic effect. To determine this internal gain, photoresponse characteristics dominated by the photoconductive effect as well as the photovoltaic effect are investigated. When the device is turned off, it acts as a photoconductor, and by calculating photoconductor gain, the primary photodetected power can be determined, which indicates the absorbed optical power. The ratio between this and the photodetected power due to the photovoltaic effect represents phototransistor internal gain. It is demonstrated that the phototransistor internal gain is function of optical modulation frequency. (C) 2004 American Institute of Physics.
引用
收藏
页码:3780 / 3782
页数:3
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