共 11 条
ELECTRON-TRANSPORT PROPERTIES OF STRAINED INXGA1-XAS
被引:61
作者:

THOBEL, JL
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机构: Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois

BAUDRY, L
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机构: Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois

CAPPY, A
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机构: Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois

BOUREL, P
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机构: Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois

FAUQUEMBERGUE, R
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机构: Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois
机构:
[1] Centre Hyperfréquences et Semiconducteurs, LA CNRS 287, Université des Sciences et Techniques de Lille Flandre Artois
关键词:
D O I:
10.1063/1.102780
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
As a first approach to the study of strained pseudomorphic materials, we have used a Monte Carlo method to calculate the effect of strain on electron transport properties of bulk InGaAs. Strain-induced velocity reduction is found to be much more pronounced for InGaAs grown on GaAs substrate than for InGaAs grown on InP substrate.
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页码:346 / 348
页数:3
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共 11 条
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