Layered perovskites with giant spontaneous polarizations for nonvolatile memories

被引:402
作者
Chon, U
Jang, HM [1 ]
Kim, MG
Chang, CH
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Pohang Univ Sci & Technol, Natl Res Lab Ferroelect Phase Transit, Pohang 790784, South Korea
[3] Res Inst Ind Sci & Technol, Pohang 790330, South Korea
[4] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
关键词
D O I
10.1103/PhysRevLett.89.087601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A series of titanate-based layered perovskites having large values of the spontaneous polarization P-s were developed for their applcations to nonvolatile ferroelectric random access memories. Among these, the Nd-modified bismuth titanate [Bi4-xNdxTi3O12 (BNdT)] system exhibited the most remarkable ferroelectric properties. The c-axis oriented BNdT capacitor was characterized by a switchable remanent polarization 2P(r) of over 100 muC/cm(2) and imprinting and fatigue-free behavior. The active Ti site responsible for the giant P-s was identified with the help of Rietveld analysis, x-ray absorption near-edge structure study, and ab initio quantum computations.
引用
收藏
页码:1 / 087601
页数:4
相关论文
共 17 条
[1]   INFLUENCE OF PLATINUM INTERLAYERS ON THE ELECTRICAL-PROPERTIES OF RUO2/PB(ZR0.53TI0.47)O-3/RUO2 CAPACITOR HETEROSTRUCTURES [J].
ALSHAREEF, HN ;
BELLUR, KR ;
KINGON, AI ;
AUCIELLO, O .
APPLIED PHYSICS LETTERS, 1995, 66 (02) :239-241
[2]   Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure [J].
Ankudinov, AL ;
Ravel, B ;
Rehr, JJ ;
Conradson, SD .
PHYSICAL REVIEW B, 1998, 58 (12) :7565-7576
[3]   The physics of ferroelectric memories [J].
Auciello, O ;
Scott, JF ;
Ramesh, R .
PHYSICS TODAY, 1998, 51 (07) :22-27
[4]   Formation and characteristics of highly c-axis-oriented Bi3.25La0.75Ti3O12 thin films on SiO2/Si(100) and Pt/Ti/SiO2/Si(100) substrates [J].
Chon, U ;
Jang, HM ;
Lee, SH ;
Yi, GC .
JOURNAL OF MATERIALS RESEARCH, 2001, 16 (11) :3124-3132
[5]   Fatigue-free behavior of highly oriented Bi3.25La0.75Ti3O12 thin films grown on Pt/Ti/SiO2/Si(100) by metalorganic solution decomposition [J].
Chon, U ;
Yi, GC ;
Jang, HM .
APPLIED PHYSICS LETTERS, 2001, 78 (05) :658-660
[6]   FATIGUE-FREE FERROELECTRIC CAPACITORS WITH PLATINUM-ELECTRODES [J].
DEARAUJO, CAP ;
CUCHIARO, JD ;
MCMILLAN, LD ;
SCOTT, MC ;
SCOTT, JF .
NATURE, 1995, 374 (6523) :627-629
[7]   SURFACE-DEFECTS OF TIO2(110) - A COMBINED XPS, XAES AND ELS STUDY [J].
GOPEL, W ;
ANDERSON, JA ;
FRANKEL, D ;
JAEHNIG, M ;
PHILLIPS, K ;
SCHAFER, JA ;
ROCKER, G .
SURFACE SCIENCE, 1984, 139 (2-3) :333-346
[8]   Device physics - Memories are made of ... [J].
Kingon, A .
NATURE, 1999, 401 (6754) :658-659
[9]   RETENTION AND IMPRINT PROPERTIES OF FERROELECTRIC THIN-FILMS [J].
LEE, JJ ;
THIO, CL ;
DESU, SB .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 151 (01) :171-182
[10]   Highly c-axis oriented Pb(Zr,Ti)O3 thin films grown on Ir electrode barrier and their electrical properties [J].
Lee, KB ;
Tirumala, S ;
Desu, SB .
APPLIED PHYSICS LETTERS, 1999, 74 (10) :1484-1486