Emission spectrometry diagnostic of sputtered titanium in magnetron amplified discharges

被引:28
作者
Nouvellon, C
Konstantinidis, S
Dauchot, JP
Wautelet, M
Jouan, PY
Ricard, A
Hecq, M
机构
[1] Univ Mons, Lab Chim Inorgan & Analyt Mat Nova, B-7000 Mons, Belgium
[2] Univ Valencia, LAMAC, F-59600 Maubeuge, France
[3] Univ Toulouse 3, CPAT, F-31062 Toulouse, France
关键词
D O I
10.1063/1.1481780
中图分类号
O59 [应用物理学];
学科分类号
摘要
The plasma of a dc discharge amplified by a rf coil is studied by emission spectroscopy. The effects of the induction coil are studied for titanium sputtered in an argon gas. The pressure range is 5-40 mTorr with 100 to 1000 W dc applied at the cathode and 0 to 500 W in the rf coil. The titanium emission line intensities are reported versus rf power. At high rf power and high pressure, titanium emission saturates while there is a linear increase with rf power for titanium ions emission. These results suggest a two-step mechanism for the production of excited titanium ions. With such a mechanism, titanium neutral is mainly lost by ion production (the diffusion loss is lower) and titanium ion is mainly lost by diffusion (loss by second ionization of Ti+ is weak). The Ti/Ar emission line ratio, representing the titanium density, decreases when a rf power is applied to the coil as a result of an efficient titanium ionization reaction by electrons. (C) 2002 American Institute of Physics.
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页码:32 / 36
页数:5
相关论文
共 23 条
[1]   Emission characteristics of the dc, 100 kHz and 13.5 MHz hollow cathode discharges [J].
BorkowskaBurnecka, J ;
Zyrnicki, W .
SPECTROSCOPY LETTERS, 1997, 30 (04) :701-716
[2]   A spectroscopic study of DC magnetron and RF coil plasmas in ionised physical vapour deposition [J].
Christou, C ;
Chiu, KF ;
Barber, ZH .
VACUUM, 2000, 58 (2-3) :250-255
[3]   Tomography of optical emission line intensities of a radio-frequency magnetron discharge [J].
Debal, F ;
Wautelet, M ;
Dauchot, JP ;
Hecq, M .
APPLIED SPECTROSCOPY, 1997, 51 (09) :1340-1345
[4]   Spatially-resolved spectroscopic optical emission of dc-magnetron sputtering discharges in argon-nitrogen gas mixtures [J].
Debal, F ;
Wautelet, M ;
Bretagne, J ;
Dauchot, JP ;
Hecq, M .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 2000, 9 (02) :152-160
[5]   Comparison of direct current and radio frequency argon magnetron discharges by optical emission and absorption spectroscopy [J].
Dony, MF ;
Ricard, A ;
Wautelet, M ;
Dauchot, JP ;
Hecq, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (04) :1890-1896
[6]   POPULATIONS IN THE METASTABLE AND THE RESONANCE LEVELS OF ARGON AND STEPWISE IONIZATION EFFECTS IN A LOW-PRESSURE ARGON POSITIVE-COLUMN [J].
FERREIRA, CM ;
LOUREIRO, J ;
RICARD, A .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (01) :82-90
[7]   Antenna sputtering in an internal inductively coupled plasma for ionized physical vapor deposition [J].
Foster, JE ;
Wang, W ;
Wendt, AE ;
Booske, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (02) :532-535
[8]   Study of an argon magnetron discharge used for molybdenum sputtering. II: spectroscopic analysis and comparison with the model [J].
Guimaraes, F. ;
Almeida, J. B. ;
Bretagne, J. .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 1993, 2 (03) :138-144
[9]   LANGMUIR PROBE AND OPTICAL-EMISSION SPECTROSCOPIC STUDIES OF AR AND O-2 PLASMAS [J].
HOPE, DAO ;
COX, TI ;
DESHMUKH, VGI .
VACUUM, 1987, 37 (3-4) :275-277
[10]   Ionization enhancement in ionized magnetron sputter deposition [J].
Joo, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (01) :23-29