Fabrication and optical transition dynamics of Er-doped ZnO thin films formed on Si substrates

被引:49
作者
Zhao, X
Komuro, S
Isshiki, H
Aoyagi, Y
Sugano, T
机构
[1] RIKEN, Inst Phys & Chem Res, Frontier Res Program, Wako, Saitama 3510198, Japan
[2] Toyo Univ, Fac Engn, Kawagoe, Saitama 3508585, Japan
关键词
erbium; zinc oxide; photoluminescence; laser ablation;
D O I
10.1016/S0022-2313(99)00545-1
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Er-doped ZnO (ZnO :Er) thin films fabricated on Si substrates were investigated by photoluminescence (Pt) and PL excitation (PLE) spectroscopy. The ZnO : Er thin films emit sharp and intense 1.54 mu m luminescence. It is shown that the Er-related PL gives rise to different features under direct and indirect excitations. An over band-gap excitation leads to a faster lifetime of the 1.54 mu m PL indicating a strong interaction of electron-hole pairs in the host with 4f electrons in the Er3+ ions. The ZnO:Er is a promising candidate for optoelectronic devices excited by carrier injection because of its high electrical conductivity. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1254 / 1256
页数:3
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