Synchrotron-based photoelectron microscopy

被引：32

作者：

Barinov, Alexei ^{[1
]}

Dudin, Pavel ^{[1
]}

Gregoratti, Luca ^{[1
]}

Locatelli, Andrea ^{[1
]}

Mentes, Tevfik Onur ^{[1
]}

Nino, Miquel Angel ^{[1
]}

Kiskinova, Maya ^{[1
]}

机构：

[1] Sincrotrone Trieste, I-34012 Trieste, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2009年 / 601卷 / 1-2期

关键词：

X-ray photoemission electron microscopy; Scanning photoelectron microscopy; Surfaces; Interfaces; Surface reactions; Nanostructures; PHOTOEMISSION ELECTRON-MICROSCOPY; CATALYTIC SURFACE; ATOMIC-STRUCTURE; INITIAL-STAGES; ALKALI-METAL; X-RAY; SPECTROSCOPY; SPECTROMICROSCOPY; REDISTRIBUTION; INTERFACES;

D O I：

10.1016/j.nima.2008.12.157

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The paper is a brief overview of the operation principles and the potentials of the scanning photorelectron microscopes (SPEM) and X-ray photoemission electron microscopes (XPEEM) operating at synchrotron facilities. Selected results will illustrate the impact of high spatial resolution for microcharacterization of the surface composition and electronic structure, a key issue for analysis of technologically relevant materials and for fundamental understanding of many unexplored surface phenomena. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：195 / 202

页数：8

共 60 条

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