Thickness dependence of the optical anisotropy for porphyrin octaester Langmuir- Schaefer films

被引:31
作者
Goletti, C
Paolesse, R
Dalcanale, E
Berzina, T
Di Natale, C
Bussetti, G
Chiaradia, P
Froiio, A
Cristofolini, L
Costa, M
D'Amico, A
机构
[1] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[2] Univ Roma Tor Vergata, Unita INFM, I-00133 Rome, Italy
[3] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, I-00133 Rome, Italy
[4] Univ Parma, Dipartimento Chim Organ & Ind, I-43100 Parma, Italy
[5] Univ Parma, Unita INSTM, I-43100 Parma, Italy
[6] Univ Parma, Dipartimento Fis, I-43100 Parma, Italy
[7] Univ Parma, Unita INFM, I-43100 Parma, Italy
[8] Univ Roma Tor Vergata, Dipartimento Ingn Elettron, I-00133 Rome, Italy
关键词
D O I
10.1021/la025756l
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have studied the optical anisotropy of porphyrin layers with different thicknesses deposited onto gold substrates by the Langmuir-Schaefer technique. In coincidence with the Soret band of the molecule, the optical spectral line shape as determined by reflectance anisotropy spectroscopy exhibits a characteristic, large structure, which changes from a "peaklike" to a "derivative-like" shape at a well-defined thickness (8-10 monolayers). We interpret this result in the framework of electronic effects due to structural changes in the layers, yielding solid-state effects originating from the coupling of the pi orbitals of the porphyrin macrocycles.
引用
收藏
页码:6881 / 6886
页数:6
相关论文
共 37 条
[1]  
Alivisatos AP, 1998, ADV MATER, V10, P1297
[2]   Photon-induced localization and final-state correlation effects in optically absorbing materials [J].
Aspnes, DE ;
Mantese, L ;
Bell, KA ;
Rossow, U .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04) :2367-2372
[3]   Surface and interface effects on ellipsometric spectra of crystalline Si [J].
Bell, KA ;
Mantese, L ;
Rossow, U ;
Aspnes, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04) :1205-1211
[4]   LANGMUIR-BLODGETT-FILMS OF BIPOLAR LIPIDS FROM THERMOPHILIC ARCHAEA [J].
BERZINA, TS ;
TROITSKY, VI ;
VAKULA, S ;
RICCIO, A ;
MORANA, A ;
DEROSA, M ;
DANTE, S ;
MACCIONI, E ;
RUSTICHELLI, F ;
ACCOSSATO, P ;
NICOLINI, C .
MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC MATERIALS SENSORS AND SYSTEMS, 1995, 3 (01) :13-21
[5]   Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces [J].
Chiaradia, P ;
Del Sole, R .
SURFACE REVIEW AND LETTERS, 1999, 6 (3-4) :517-528
[6]   Glass transition and relaxation following photoperturbation in thin polymeric films [J].
Cristofolini, L ;
Arisi, S ;
Fontana, MP .
PHYSICAL REVIEW LETTERS, 2000, 85 (23) :4912-4915
[7]  
Della Sala F, 2000, PHYS STATUS SOLIDI B, V217, P565, DOI 10.1002/(SICI)1521-3951(200001)217:1<565::AID-PSSB565>3.0.CO
[8]  
2-F
[9]   Interface and surface effects on the glass transition in thin polystyrene films [J].
DeMaggio, GB ;
Frieze, WE ;
Gidley, DW ;
Zhu, M ;
Hristov, HA ;
Yee, AF .
PHYSICAL REVIEW LETTERS, 1997, 78 (08) :1524-1527
[10]   Optical anisotropy of Langmuir-Blodgett sapphyrin films [J].
Di Natale, C ;
Goletti, C ;
Paolesse, R ;
Della Sala, F ;
Drago, M ;
Chiaradia, P ;
Lugli, P ;
D'Amico, A .
APPLIED PHYSICS LETTERS, 2000, 77 (20) :3164-3166