Thickness dependence of the optical anisotropy for porphyrin octaester Langmuir- Schaefer films

被引:31
作者
Goletti, C
Paolesse, R
Dalcanale, E
Berzina, T
Di Natale, C
Bussetti, G
Chiaradia, P
Froiio, A
Cristofolini, L
Costa, M
D'Amico, A
机构
[1] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[2] Univ Roma Tor Vergata, Unita INFM, I-00133 Rome, Italy
[3] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, I-00133 Rome, Italy
[4] Univ Parma, Dipartimento Chim Organ & Ind, I-43100 Parma, Italy
[5] Univ Parma, Unita INSTM, I-43100 Parma, Italy
[6] Univ Parma, Dipartimento Fis, I-43100 Parma, Italy
[7] Univ Parma, Unita INFM, I-43100 Parma, Italy
[8] Univ Roma Tor Vergata, Dipartimento Ingn Elettron, I-00133 Rome, Italy
关键词
D O I
10.1021/la025756l
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have studied the optical anisotropy of porphyrin layers with different thicknesses deposited onto gold substrates by the Langmuir-Schaefer technique. In coincidence with the Soret band of the molecule, the optical spectral line shape as determined by reflectance anisotropy spectroscopy exhibits a characteristic, large structure, which changes from a "peaklike" to a "derivative-like" shape at a well-defined thickness (8-10 monolayers). We interpret this result in the framework of electronic effects due to structural changes in the layers, yielding solid-state effects originating from the coupling of the pi orbitals of the porphyrin macrocycles.
引用
收藏
页码:6881 / 6886
页数:6
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