Analysis of reflectometers for surface anisotropy

被引：40

作者：

Salvati, A ^{[1
]}

Chiaradia, P

机构：

[1] Univ Roma Tor Vergata, Dept Phys, Rome, Italy

[2] Univ Roma Tor Vergata, Ist Nazl Fis Mat, Rome, Italy

来源：

APPLIED OPTICS | 2000年 / 39卷 / 31期

关键词：

D O I：

10.1364/AO.39.005820

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A succinct analysis of normal-incidence reflectometers for surface anisotropy, based on the Jones-matrix formalism, is performed. In particular, two relevant configurations with and without analyzers are compared and discussed. The latter is found to be more user friendly than the former, since most errors vanish to the first order of approximation. Therefore the optical alignment is greatly simplified. On the other hand, this configuration does not yield complete physical information. We discuss how this drawback can be circumvented in surface studies by use of the three-layer model and a Kramers-Kronig analysis. (C) 2000 Optical Society of America OCIS codes: 240.0240, 120.5700, 230.1040, 230.4110, 260.1440, 300.6470.

引用

页码：5820 / 5826

页数：7

共 19 条

[1] ANISOTROPIES IN THE ABOVE BAND-GAP OPTICAL-SPECTRA OF CUBIC SEMICONDUCTORS [J].