Theory of filling of high-aspect ratio trenches and vias in presence of additives

被引:128
作者
West, AC [1 ]
机构
[1] Columbia Univ, Dept Chem Engn, New York, NY 10027 USA
关键词
D O I
10.1149/1.1393179
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Numerical simulations are employed to estimate the importance of parameters such as leveling-additive mobility and concentration on a process's capability of filling trenches or vias of a given size. Geometries relevant to ultralarge scale integration-copper technologies are considered. Simulation results are presented within the context of a suggested experimental protocol. The importance of controlling the operating conditions is demonstrated. For example, simulations indicate that a poorly controlled additive concentration can lead to an increase in void size over that which would be obtained in an additive-free bath. Finally, the design of robust processes is discussed in terms of the need to account for apparently random variations in the process. (C) 2000 The Electrochemical Society. S0013-4651(99)01-104-0. All rights reserved.
引用
收藏
页码:227 / 232
页数:6
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