Standardization of a micro-PIXE system using NIST iron- and nickel-based alloy reference materials

被引：24

作者：

Nejedly, Z ^{[1
]}

Campbell, JL ^{[1
]}

机构：

[1] Univ Guelph, Guelph Waterloo Program Grad Work Phys, Dept Phys, Guelph, ON N1G 2W1, Canada

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2000年 / 160卷 / 03期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/S0168-583X(99)00616-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Five NIST standard reference Mo-bearing alloys are evaluated in the context of standardizing a micro-PIXE system that operates with a range of aluminum X-ray absorbers. The instrumental constant H is determined with accuracy of about 1% via the Mo content, and the absorber thickness is subsequently deduced via the Fe or Ni content. The influence of alloy heterogeneity is examined, and it is found necessary to raster the beam spot to compensate. The steel SRM C1296 is our choice for characterization when the absorber thickness is 300 mu m or less. The Ni-based alloy SRM 1160 is suitable for absorbers in the range 300-500 mu m. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：415 / 423

页数：9

共 11 条

[1]

Berger M. J., 1987, 873597 NBSIR

[2] QUANTITATIVE PIXE MICROANALYSIS OF THICK SPECIMENS [J].

CAMPBELL, JL ;

HIGUCHI, D ;

MAXWELL, JA ;

TEESDALE, WJ .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 77 (1-4) :95-109

[3] AN EXACT TREATMENT OF SECONDARY AND TERTIARY FLUORESCENCE ENHANCEMENT IN PIXE [J].

CAMPBELL, JL ;

WANG, JX ;

MAXWELL, JA ;

TEESDALE, WJ .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 43 (04) :539-555

[4]

CZAMANSKE GK, 1993, AM MINERAL, V78, P893

[5] ATOMIC PHOTOEFFECT CROSS-SECTIONS FOR BERYLLIUM, CARBON, SILICON AND COPPER FROM 5 TO 20 KEV [J].

GERWARD, L .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1989, 22 (12) :1963-1969

[6]

Johansson S.A.E., 1995, PARTICLE INDUCED XRA

[7] THE GUELPH-PIXE SOFTWARE PACKAGE-II [J].

MAXWELL, JA ;

TEESDALE, WJ ;

CAMPBELL, JL .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 95 (03) :407-421

[8] QUANTITATIVE PIXE MICROANALYSIS OF GEOLOGICAL MATERIAL USING THE CSIRO PROTON MICROPROBE [J].

RYAN, CG ;

COUSENS, DR ;

SIE, SH ;

GRIFFIN, WL ;

SUTER, GF ;

CLAYTON, E .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 47 (01) :55-71

[9]

SALOMON EB, 1986, 863431 NBSIR

[10]

SCOFIELD JH, 1973, 51326 UCRL LAWR LIV

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