Optical properties of anisotropic materials: an experimental approach

被引:19
作者
Alonso, MI [1 ]
Garriga, M [1 ]
机构
[1] CSIC, Inst Ciencia Mat Barcelona, E-08193 Bellaterra, Spain
关键词
optical anisotropy; complex dielectric function; ellipsometry;
D O I
10.1016/j.tsf.2003.12.061
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this contribution, we review the analysis of ellipsometric spectra of general anisotropic materials from an experimental point of view. The basic framework of data analysis is the numerical solution of the exact ellipsometric equations by using the 4 x 4 transfer matrix algorithm. The flexibility of our approach allows undertaking the study of the dielectric tensor in general systems. We illustrate the practical use of our method with different examples. In particular we discuss the study of systems of reduced symmetry where principal axes of the dielectric tensor are a priori unknown, as monoclinic alpha-PTCDA and anthracene. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:124 / 131
页数:8
相关论文
共 23 条
  • [1] Anisotropic optical properties of single crystalline PTCDA studied by spectroscopic ellipsometry
    Alonso, MI
    Garriga, M
    Karl, N
    Ossó, JO
    Schreiber, F
    [J]. ORGANIC ELECTRONICS, 2002, 3 (01) : 23 - 31
  • [2] Ellipsometric measurement of the dielectric tensor of Nd2-xCexCuO4-delta
    Alonso, MI
    Tortosa, S
    Garriga, M
    Pinol, S
    [J]. PHYSICAL REVIEW B, 1997, 55 (05): : 3216 - 3221
  • [3] DETERMINATION OF THE DIELECTRIC TENSOR IN ANISOTROPIC MATERIALS
    ALONSO, MI
    GARRIGA, M
    ALSINA, F
    PINOL, S
    [J]. APPLIED PHYSICS LETTERS, 1995, 67 (05) : 596 - 598
  • [4] Optical functions and electronic structure of CuInSe2, CuGaSe2, CuInS2, and CuGaS2 -: art. no. 075203
    Alonso, MI
    Wakita, K
    Pascual, J
    Garriga, M
    Yamamoto, N
    [J]. PHYSICAL REVIEW B, 2001, 63 (07):
  • [5] Optical determination of growth variants in ordered GaInP
    Alsina, F
    Garriga, M
    Alonso, MI
    Tortosa, S
    Pascual, J
    Geng, C
    Scholz, F
    Glew, RW
    [J]. SOLID STATE COMMUNICATIONS, 1997, 101 (10) : 757 - 760
  • [7] EFFECTS OF COMPONENT OPTICAL-ACTIVITY IN DATA REDUCTION AND CALIBRATION OF ROTATING-ANALYZER ELLIPSOMETERS
    ASPNES, DE
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (06) : 812 - 819
  • [8] Azzam R.M.A., 1977, Ellipsometry and Polarized Light
  • [9] GENERALIZED ELLIPSOMETRY FOR SURFACES WITH DIRECTIONAL PREFERENCE - APPLICATION TO DIFFRACTION GRATINGS
    AZZAM, RMA
    BASHARA, NM
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1972, 62 (12) : 1521 - &
  • [10] Generalized magneto-optical ellipsometry
    Berger, A
    Pufall, MR
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (07) : 965 - 967