Monte Carlo calculation of noise and small-signal impedance spectra in submicrometer GaAs n(+)nn(+) diodes

被引:28
作者
Starikov, E
Shiktorov, P
Gruzinskis, V
Varani, L
Vaissiere, JC
Nougier, JP
Reggiani, L
机构
[1] UNIV MONTPELLIER 2,CTR ELECTR MONTPELLIER,F-34095 MONTPELLIER 05,FRANCE
[2] UNIV LECCE,DIPARTIMENTO SCI MAT,I-73100 LECCE,ITALY
[3] UNIV LECCE,IST NAZL FIS MAT,I-73100 LECCE,ITALY
关键词
D O I
10.1063/1.360937
中图分类号
O59 [应用物理学];
学科分类号
摘要
The time-and-frequency behavior of hot-carrier noise in submicrometer n(+)nn(+) GaAs diodes is investigated theoretically using the Monte Carlo method. We have continuously investigated the noise from current-to-voltage operation mode by calculating the noise-power spectrum at the terminals of a noiseless load-resistance R connected in series with the diode. By varying appropriately the value of R we have calculated the small-signal impedance of the diode and then obtained the full spectrum of the noise temperature. tinder voltage-operation mode the current-noise spectrum exhibits two resonant peaks at the transit-time and plasma frequencies, respectively. Under current operation mode, all current oscillations are effectively damped, and the voltage-noise spectrum exhibits a quasi-lorentzian shape, which vanishes at the transit-time frequency. The behavior of hot-carrier noise closely parallels the frequency dependence of the diode small-signal impedance, which exhibits a dynamic negative differential resistance in the frequency range corresponding to the transit-time resonance. (C) 1996 American Institute of Physics.
引用
收藏
页码:242 / 252
页数:11
相关论文
共 44 条
[1]  
[Anonymous], 1965, FLUCTUATION PHENOMEN
[2]  
[Anonymous], QUANTUM THEORY ATOMS
[3]   EXPERIMENTS ON HOT-ELECTRON NOISE IN SEMICONDUCTOR-MATERIALS FOR HIGH-SPEED DEVICES [J].
BAREIKIS, V ;
LIBERIS, J ;
MATULIONIENE, I ;
MATULIONIS, A ;
SAKALAS, P .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (11) :2050-2060
[4]  
BAREIKIS V, 1994, FLUCTUATION PHENOMEN, P217
[5]   COMPUTER-SIMULATION OF TRANSFERRED ELECTRON DEVICES USING DISPLACED MAXWELLIAN APPROACH [J].
BOSCH, R ;
THIM, HW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (01) :16-25
[6]   HIGH-FIELD TRANSPORT IN GAAS, INP AND INAS [J].
BRENNAN, K ;
HESS, K .
SOLID-STATE ELECTRONICS, 1984, 27 (04) :347-357
[7]   ANALYSIS OF THE STATIONARY AND TRANSIENT AUTO-CORRELATION FUNCTION IN SEMICONDUCTORS [J].
BRUNETTI, R ;
JACOBONI, C .
PHYSICAL REVIEW B, 1984, 29 (10) :5739-5748
[8]   NOISE MODELING AND MEASUREMENT TECHNIQUES [J].
CAPPY, A .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (01) :1-10
[9]   DIFFUSION AND NOISE IN GAAS MATERIAL AND DEVICES [J].
DEMURCIA, M ;
GASQUET, D ;
ELAMRI, A ;
NOUGIER, JP ;
VANBREMEERSCH, J .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (11) :2531-2539
[10]   INFLUENCE OF AL CONTENT-X ON HOT-ELECTRON NOISE IN ALX GA1-XAS N+NN+ DEVICES - COMPARISON WITH GAAS [J].
DEMURCIA, M ;
RICHARD, E ;
VANBREMEERSCH, J ;
ZIMMERMANN, J .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (11) :2082-2086