Atomic corrugation in nc-AFM of alkali halides

被引：21

作者：

Bennewitz, R

Pfeiffer, O

Schär, S

Barwich, V

Meyer, E

Kantorovich, LN

机构：

[1] Univ Basel, Inst Phys, CH-4058 Basel, Switzerland

[2] UCL, Dept Phys & Astron, London WC1E 6BT, England

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 3-4期

关键词：

alkali halides; atomic force microscopy; atomic resolution; nanostructures; radiation damage; mixed crystals;

D O I：

10.1016/S0169-4332(01)00910-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The atomic corrugation of alkali halides measured by non-contact force microscopy undergoes strong variations at low-coordinated sites like steps. We present experimental results on structured KBr surfaces and discuss the contrast mechanisms. Chemical sensitivity of the atomic corrugation is demonstrated for a mixed alkali halide crystal. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：232 / 237

页数：6

共 9 条

[1] Dynamic SFM with true atomic resolution on alkali halide surfaces [J].

Bammerlin, M ;

Luthi, R ;

Meyer, E ;

Baratoff, A ;

Lu, J ;

Guggisberg, M ;

Loppacher, C ;

Gerber, C ;

Guntherodt, HJ .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S293-S294

[2]

BAMMERLIN M, 1997, PROBE MICROSCOPY, V1, P3

[3] Atomic-resolution images of radiation damage in KBr [J].

Bennewitz, R ;

Schär, S ;

Barwich, V ;

Pfeiffer, O ;

Meyer, E ;

Krok, F ;

Such, B ;

Kolodzej, J ;

Szymonski, M .

SURFACE SCIENCE, 2001, 474 (1-3) :L197-L202

[4] Atomically resolved edges and kinks of NaCl islands on Cu(111):: Experiment and theory [J].

Bennewitz, R ;

Foster, AS ;

Kantorovich, LN ;

Bammerlin, M ;

Loppacher, C ;

Schär, S ;

Guggisberg, M ;

Meyer, E ;

Shluger, AL .

PHYSICAL REVIEW B, 2000, 62 (03) :2074-2084

[5] Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface [J].

Guggisberg, M ;

Bammerlin, M ;

Baratoff, A ;

Lüthi, R ;

Loppacher, C ;

Battiston, FM ;

Lü, J ;

Bennewitz, R ;

Meyer, E ;

Güntherodt, HJ .

SURFACE SCIENCE, 2000, 461 (1-3) :255-265

[6] Model of noncontact scanning force microscopy on ionic surfaces [J].

Livshits, AI ;

Shluger, AL ;

Rohl, AL ;

Foster, AS .

PHYSICAL REVIEW B, 1999, 59 (03) :2436-2448

[7] ATOMIC RESOLUTION ON LIF (001) BY ATOMIC FORCE MICROSCOPY [J].

MEYER, E ;

HEINZELMANN, H ;

RUDIN, H ;

GUNTHERODT, HJ .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1990, 79 (01) :3-4

[8] DIRECT OBSERVATION OF SURFACE CHEMICAL ORDER BY SCANNING TUNNELING MICROSCOPY [J].

SCHMID, M ;

STADLER, H ;

VARGA, P .

PHYSICAL REVIEW LETTERS, 1993, 70 (10) :1441-1444

[9]

TIVINELLA U, 1997, J PHYS, V9, P11141

← 1 →