Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface

被引：31

作者：

Guggisberg, M ^{[1
]}

Bammerlin, M ^{[1
]}

Baratoff, A ^{[1
]}

Lüthi, R ^{[1
]}

Loppacher, C ^{[1
]}

Battiston, FM ^{[1
]}

Lü, J ^{[1
]}

Bennewitz, R ^{[1
]}

Meyer, E ^{[1
]}

Güntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

SURFACE SCIENCE | 2000年 / 461卷 / 1-3期

关键词：

atomic force microscopy; silicon; surface structure; morphology; roughness; and topography;

D O I：

10.1016/S0039-6028(00)00592-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Force microscopy in atomic resolution with an oscillating tip has been performed across monatomic steps of the Si(111)-(7 x 7) surface using the tunnelling current or frequency shift as the feedback parameter. The contrast of simultaneously recorded images in both feedback modes is discussed. A significant difference between tip-sample interactions on the upper and lower terrace close to a step is analyzed in detail by means of Kelvin-type measurements. No contact potential variation across the step is found. A simple model for the force contrast is suggested which takes into account the different effective interaction areas or volumes on the upper and the lower terrace. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：255 / 265

页数：11

共 44 条

[1] Molecular dynamics simulations of dynamic force microscopy: applications to the Si(111)-7 X 7 surface [J].