Structural defects and epitaxial rotation of C-60 and C-70(111) films on GeS(001)

被引:11
作者
Bernaerts, D
VanTendeloo, G
Amelinckx, S
Hevesi, K
Gensterblum, G
Yu, LM
Pireaux, JJ
Grey, F
Bohr, J
机构
[1] FAC UNIV NOTRE DAME PAIX,INST STUDIES INTERFACE SCI,LAB INTERDISCIPLINAIRE SPECT ELECT,B-5000 NAMUR,BELGIUM
[2] TECH UNIV DENMARK,DK-2800 LYNGBY,DENMARK
关键词
D O I
10.1063/1.363241
中图分类号
O59 [应用物理学];
学科分类号
摘要
A transmission electron microscopy study of epitaxial C-60 and C-70 films grown on a GeS (001) surface is presented. The relationship between the orientation of the substrate and the films and structural defects in the films, such as grain boundaries, unknown in bulk C-60 and C-70 crystals, are studied. Small misalignments of the overlayers with respect to the orientation of the substrate, so-called epitaxial rotations, exist mainly in C-70 films, but also sporadically in the C-60 overlayers. A simple symmetry model, previously used to predict the rotation of hexagonal overlayers on hexagonal substrates, is numerically tested and applied to the present situation. Some qualitative conclusions concerning the substrate-film interaction are deduced. (C) 1996 American Institute of Physics.
引用
收藏
页码:3310 / 3318
页数:9
相关论文
共 47 条
[41]   CRYSTAL-GROWTH OF C-60 THIN-FILMS ON LAYERED SUBSTRATES [J].
TANIGAKI, K ;
KUROSHIMA, S ;
FUJITA, J ;
EBBESEN, TW .
APPLIED PHYSICS LETTERS, 1993, 63 (17) :2351-2353
[42]   STRUCTURAL PHASE-TRANSITIONS IN C-70 [J].
VANTENDELOO, G ;
AMELINCKX, S ;
DEBOER, JL ;
VANSMAALEN, S ;
VERHEIJEN, MA ;
MEEKES, H ;
MEIJER, G .
EUROPHYSICS LETTERS, 1993, 21 (03) :329-334
[43]   THE STRUCTURE OF DIFFERENT PHASES OF PURE C-70 CRYSTALS [J].
VERHEIJEN, MA ;
MEEKES, H ;
MEIJER, G ;
BENNEMA, P ;
DEBOER, JL ;
VANSMAALEN, S ;
VANTENDELOO, G ;
AMELINCKX, S ;
MUTO, S ;
VANLANDUYT, J .
CHEMICAL PHYSICS, 1992, 166 (1-2) :287-297
[44]   ADSORPTION OF C60 AND C84 ON THE SI(100)2X1 SURFACE STUDIED BY USING THE SCANNING TUNNELING MICROSCOPE [J].
WANG, XD ;
HASHIZUME, T ;
SHINOHARA, H ;
SAITO, Y ;
NISHINA, Y ;
SAKURAI, T .
PHYSICAL REVIEW B, 1993, 47 (23) :15923-15930
[45]   FULLERENES AND FULLERIDES - PHOTOEMISSION AND SCANNING TUNNELING MICROSCOPY STUDIES [J].
WEAVER, JH .
ACCOUNTS OF CHEMICAL RESEARCH, 1992, 25 (03) :143-149
[46]   EPITAXIAL THIN-FILMS OF C-70 - GROWTH AND STRUCTURE CHARACTERIZATION [J].
ZHAO, WB ;
ZHANG, XD ;
YE, ZY ;
ZHANG, JL ;
LI, CY ;
YIN, DL ;
GU, ZN ;
ZHOU, XH ;
JIN, ZX .
SOLID STATE COMMUNICATIONS, 1993, 85 (04) :311-315
[47]   STUDY OF MICROSTRUCTURE OF EPITAXIAL FULLERENES FILMS [J].
ZHAO, WB ;
ZHANG, XD ;
YE, ZY ;
ZHANG, JL ;
LI, CY ;
YIN, DL ;
GU, ZN ;
ZHOU, XH ;
JIN, ZX .
THIN SOLID FILMS, 1994, 240 (1-2) :14-21