Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance

被引：33

作者：

Velha, P.

Rodier, J. C.

Lalanne, P.

Hugonin, J. P.

Peyrade, D.

Picard, E.

Charvolin, T.

Hadji, E.

机构：

[1] Univ Paris Sud, CNRS, Inst Opt, Lab Charles Fabry, F-91127 Palaiseau, France

[2] CNRS, UMR5129, Lab Technol Microelect, F-38054 Grenoble 9, France

[3] CEA, Dept Rech Fondamentale Mat Condensee, Lab Silicium Nanoelect Photon & Struct, F-38054 Grenoble, France

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 17期

关键词：

D O I：

10.1063/1.2372581

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Microcavities offering small modal volumes V approximate to 0.6 (lambda/n)(3) and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers. (c) 2006 American Institute of Physics.

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页数：3

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