Atomic resolution three-dimensional electron diffraction microscopy

被引：48

作者：

Miao, J ^{[1
]}

Ohsuna, T

Terasaki, O

Hodgson, KO

O'Keefe, MA

机构：

[1] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA

[2] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 9808577, Japan

[3] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808577, Japan

[4] Tohoku Univ, CIR, Sendai, Miyagi 9808577, Japan

[5] Stanford Univ, Dept Chem, Stanford, CA 94305 USA

[6] Lawrence Berkeley Natl Lab, Div Sci Mat, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 89卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.89.155502

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 angle from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction.

引用

页码：155502/1 / 155502/4

页数：4

共 20 条

[11] On possible extensions of X-ray crystallography through diffraction-pattern oversampling [J].