Room-temperature Al single-electron transistor made by electron-beam lithography

被引:89
作者
Pashkin, YA
Nakamura, Y
Tsai, JS
机构
[1] NEC Corp Ltd, Fundamental Res Labs, Tsukuba, Ibaraki 3058501, Japan
[2] Japan Sci & Technol Corp, Kawaguchi, Saitama 3320012, Japan
关键词
D O I
10.1063/1.126313
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a lithographically made Al single-electron transistor that shows gate modulation at room temperature. The temperature dependence of the modulation agrees with the orthodox theory, however, energy-level quantization in a tiny metallic island affects the device characteristics below 30 K. The charge-equivalent noise of the device at 300 K was measured to be similar to 4x10(-2) e/Hz(1/2) at 1 Hz and is expected to be 1000 times lower in the white-noise regime at higher frequencies. (C) 2000 American Institute of Physics. [S0003-6951(00)01416-9].
引用
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页码:2256 / 2258
页数:3
相关论文
共 9 条
[1]  
Averin D., 1991, Modern Problems in Condensed Matter Sciences, V30, P173
[2]  
AVERIN DV, 1990, ZH EKSP TEOR FIZ+, V97, P1661
[3]   OBSERVATION OF SINGLE-ELECTRON CHARGING EFFECTS IN SMALL TUNNEL-JUNCTIONS [J].
FULTON, TA ;
DOLAN, GJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (01) :109-112
[4]   QUANTUM SIZE EFFECTS IN METAL PARTICLES [J].
HALPERIN, WP .
REVIEWS OF MODERN PHYSICS, 1986, 58 (03) :533-606
[5]  
KOROTKOV AN, 1992, SPRIN S ELE, V31, P45
[6]   100-K operation of Al-based single-electron transistors [J].
Nakamura, Y ;
Chen, CD ;
Tsai, JS .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (11A) :L1465-L1467
[7]   Gate-voltage studies of discrete electronic states in aluminum nanoparticles [J].
Ralph, DC ;
Black, CT ;
Tinkham, M .
PHYSICAL REVIEW LETTERS, 1997, 78 (21) :4087-4090
[8]   Single-electron charging effects in Nb/Nb oxide-based single-electron transistors at room temperature [J].
Shirakashi, J ;
Matsumoto, K ;
Miura, N ;
Konagai, M .
APPLIED PHYSICS LETTERS, 1998, 72 (15) :1893-1895
[9]   FABRICATION TECHNIQUE FOR SI SINGLE-ELECTRON TRANSISTOR OPERATING AT ROOM-TEMPERATURE [J].
TAKAHASHI, Y ;
NAGASE, M ;
NAMATSU, H ;
KURIHARA, K ;
IWDATE, K ;
NAKAJIMA, K ;
HORIGUCHI, S ;
MURASE, K ;
TABE, M .
ELECTRONICS LETTERS, 1995, 31 (02) :136-137