The materials science beamline EDDI for energy-dispersive analysis of subsurface residual stress gradients

被引:16
作者
Genzel, Ch. [1 ]
Denks, I. A. [1 ]
Klaus, M. [1 ]
机构
[1] Hahn Meitner Inst Berlin GmbH, Bereich Strukturforsch, D-12489 Berlin, Germany
来源
RESIDUAL STRESSES VII | 2006年 / 524-525卷
关键词
synchrotron radiation; energy dispersive diffraction; residual stress gradient analysis;
D O I
10.4028/www.scientific.net/MSF.524-525.193
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In April 2005 the materials science beamline EDDI (Energy Dispersive DIffraction), which the HMI operates at the Berlin synchrotron storage ring BESSY, started user service. The high energy white synchrotron beam up to about 150 keV used for the diffraction experiments is provided by a superconducting 7 Tesla multipole wiggler. Starting with some basic information on the technical parameters of the beamline, its set-up and measuring facilities, the paper focuses on the application of white beam diffraction to the analysis of residual stress fields in the near surface zone of polycrystalline materials. The concept of a program system is introduced, which we offer to our users for preparing and evaluating their measurements performed at the EDDI beamline.
引用
收藏
页码:193 / 198
页数:6
相关论文
共 11 条
[1]  
COX DE, 1991, HDB SYNCHROTRON RAD, V3, P155
[2]  
DENKS IA, UNPUB
[3]   Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume [J].
Genzel, C ;
Stock, C ;
Reimers, W .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2004, 372 (1-2) :28-43
[4]   X-RAY DIFFRACTION - NEW HIGH-SPEED TECHNIQUE BASED ON X-RAY SPECTROGRAPHY [J].
GIESSEN, BC ;
GORDON, GE .
SCIENCE, 1968, 159 (3818) :973-&
[5]   Simultaneous tomography and diffraction analysis of creep damage [J].
Pyzalla, A ;
Camin, B ;
Buslaps, T ;
Di Michiel, M ;
Kaminski, H ;
Kottar, A ;
Pernack, A ;
Reimers, W .
SCIENCE, 2005, 308 (5718) :92-95
[6]   Recent developments in hard X-ray tomography [J].
Rau, C ;
Weitkamp, T ;
Snigirev, A ;
Schroer, CG ;
Tümmler, J ;
Lengeler, B .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 :929-931
[7]   Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction [J].
W. Reimers ;
M. Broda ;
G. Brusch ;
D. Dantz ;
K. -D. Liss ;
A. Pyzalla ;
T. Schmackers ;
T. Tschentscher .
Journal of Nondestructive Evaluation, 1998, 17 (3) :129-140
[8]   EVALUATION OF STRONGLY NONLINEAR SURFACE-STRESS FIELDS SIGMA-XX(ZETA) AND SIGMA-YY(ZETA) FROM DIFFRACTION EXPERIMENTS [J].
RUPPERSBERG, H ;
DETEMPLE, I ;
KRIER, J .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 116 (02) :681-687
[9]   EVALUATION OF THE STRESS-FIELD IN A GROUND STEEL PLATE FROM ENERGY-DISPERSIVE X-RAY-DIFFRACTION EXPERIMENTS [J].
RUPPERSBERG, H ;
DETEMPLE, I .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1993, 161 (01) :41-44
[10]   Problems related to energy-dispersive X-ray stress analysis performed in reflection geometry [J].
Stock, C ;
Genzel, C ;
Reimers, W .
ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 :13-18