Surface traveling X-rays from organic thin film

被引：6

作者：

Hayashi, K ^{[1
]}

Kawai, J ^{[1
]}

机构：

[1] Kyoto Univ, Dept Mat Sci & Engn, Sakyo Ku, Kyoto 60601, Japan

来源：

PHYSICA B-CONDENSED MATTER | 2000年 / 283卷 / 1-3期

关键词：

organic thin film; X-ray standing wave; X-ray transmission; X-ray waveguide; grazing incidence;

D O I：

10.1016/S0921-4526(99)01907-9

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

When a white X-ray beam impinges on a flat surface under grazing incidence conditions, X-rays at certain energies travel along the material surface. These X-rays are called "surface traveling X-rays" in this paper. We observed the surface traveling X-rays from n-C33H68/Si, and found two types of peaks through the n-C33H68 layer. The energies of these peaks can be calculated from the structure of the sample. Here, the density and thickness of n-C33H68 film were determined by fitting the calculated energies to the experimental ones. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：139 / 142

页数：4

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