Manganese concentration and low-temperature annealing dependence of Ga1-xMnxAs by x-ray absorption spectroscopy -: art. no. 233201

被引:45
作者
Ishiwata, Y [1 ]
Watanabe, M
Eguchi, R
Takeuchi, T
Harada, Y
Chainani, A
Shin, S
Hayashi, T
Hashimoto, Y
Katsumoto, S
Iye, Y
机构
[1] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan
[2] RIKEN, SPring 8, Mikazuki, Hyogo 6795143, Japan
[3] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan
[4] Inst Plasma Res, Bhat 382428, Gandhinagar, India
[5] Japan Sci & Technol Corp, CREST, Tokyo 1710031, Japan
关键词
D O I
10.1103/PhysRevB.65.233201
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The Mn-site-projected electronic structure of the diluted magnetic semiconductors Ga1-xMnxAs (x=0.032, 0.038, 0.047, 0.052, 0.058) of as-grown and low-temperature (LT) annealed samples are systematically studied using high-resolution Mn 2p absorption spectroscopy. The study exhibits coexistence of the ferromagnetic Mn2+ ion and the paramagnetic Mn-As complex that transforms into the ferromagnetic component with LT annealing. The ratio of ferromagnetic to paramagnetic components is directly related to the x dependence of the hole density and ferromagnetic critical temperature.
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页码:1 / 4
页数:4
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