Quantitative electrostatic force microscopy-phase measurements

被引：82

作者：

Lei, CH ^{[1
]}

Das, A ^{[1
]}

Elliott, M ^{[1
]}

Macdonald, JE ^{[1
]}

机构：

[1] Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3YB, S Glam, Wales

来源：

NANOTECHNOLOGY | 2004年 / 15卷 / 05期

关键词：

D O I：

10.1088/0957-4484/15/5/038

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy (SPM) technique used to measure electrostatic force gradient. EFM-phase has a higher resolution than scanning Kelvin probe microscopy (SKPM or SKM), but unlike SKPM it does not yield a direct measurement of local potential. Analytical calculations of tip-surface capacitances and their gradients are presented, and the origin of the measurement resolution in EFM-phase and SKPM is explained based on the calculation results. We show that EFM-phase data fit the analytical calculation well, and can be interpreted using a simple analytic model, which allows phase shift to be related to the local surface potential. The analytic formula is easy to calibrate and can be used to convert the EFM-phase data to potential data. This procedure is demonstrated on a poly-(3-hexylthiophene-2,5-diyl) (P3HT) thin film, contacted with Au electrodes, and the potential distributions of the Au/P3HT/Au structure under various biases are presented.

引用

页码：627 / 634

页数：8

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