Insight in the outside: New applications of low-energy ion scattering

被引：17

作者：

Brongersma, HH

Gildenpfennig, A

van der Gon, AWD

van de Grampel, RD

Jansen, WPA

Knoester, A

Laven, J

Viitanen, MM

机构：

[1] Eindhoven Univ Technol, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands

[2] Calipso BV, NL-5600 MB Eindhoven, Netherlands

[3] Eindhoven Univ Technol, Lab Polymer Chem & Coatings Technol, NL-5600 MB Eindhoven, Netherlands

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2002年 / 190卷

关键词：

surface science; LEIS; ISS; ion spectroscopy; surface analysis; catalysts;

D O I：

10.1016/S0168-583X(01)01314-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Low energy ion scattering is used to selectively probe the outermost atomic layer of the surface. The development of double toroidal analyzers has improved the detection sensitivity of low energy ion scattering by orders of magnitude. The features of these analyzers are discussed. It is shown that the absence of matrix effects makes it possible to quantify the surface density of fluorine in polymers with a LiF(1 0 0) surface. The extreme surface sensitivity of LEIS also enables one to study intramolecular segregation processes. As an example the aging of a polypropylene surface that has been activated with atomic oxygen is described. As an example of the LEIS analysis of highly dispersed isolating surfaces, the formation of coke on a commercial three-way catalyst is discussed. (C) 2002 Published by Elsevier Science B.V.

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收藏

页码：11 / 18

页数：8

相关论文

共 29 条

[1] PREFERENTIAL SPUTTERING OF B STUDIED BY LOW-ENERGY ION-SCATTERING USING THE DUAL-ISOTOPE SURFACE-COMPOSITION (DISK) METHOD [J].

ACKERMANS, PAJ ;

CREUWELS, MAP ;

BRONGERSMA, HH ;

SCANLON, PJ .

SURFACE SCIENCE, 1990, 227 (03) :361-368

[2] THE USE OF A CALIBRATION IN LOW-ENERGY ION-SCATTERING - PREFERENTIAL SPUTTERING AND S SEGREGATION IN CUPD ALLOYS [J].

ACKERMANS, PAJ ;

KRUTZEN, GCR ;

BRONGERSMA, HH .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 45 (1-4) :384-389

[3] A round robin experiment of elemental sensitivity factors in low-energy ion scattering [J].

Brongersma, HH ;

Carrere-Fontaine, H ;

Cortenraad, R ;

van der Gon, AWD ;

Scanlon, PJ ;

Spolveri, I ;

Cortigiani, B ;

Bardi, U ;

Taglauer, E ;

Reiter, S ;

Labich, S ;

Bertrand, P ;

Houssiau, L ;

Speller, S ;

Parascandola, S ;

Unlu-Lachnitt, H ;

Heiland, W .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 142 (03) :377-386

[4]

BRONGERSMA HH, 1981, PHILIPS J RES, V36, P1

[5] DEVELOPMENTS IN LOW-ENERGY ION-SCATTERING FROM SURFACES [J].

BRONGERSMA, HH ;

BERGMANS, RH ;

BUIJS, LGC ;

JACOBS, JP ;

KRUSEMAN, AC ;

SEVERIJNS, CA ;

VANWELZENIS, RG .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 68 (1-4) :207-212

[6] ANALYSIS OF OUTERMOST ATOMIC LAYER OF A SURFACE BY LOW-ENERGY ION SCATTERING [J].

BRONGERSMA, HH ;

MUL, PM .

SURFACE SCIENCE, 1973, 35 (01) :393-412

[7] ION SCATTERING - SPECTROSCOPIC TOOL FOR STUDY OF OUTERMOST ATOMIC LAYER OF A SOLID SURFACE [J].

BRONGERSMA, HH ;

MUL, PM .

CHEMICAL PHYSICS LETTERS, 1972, 14 (03) :380-+

[8] Electron-transfer processes in the interaction of fluorine with a chlorine-covered Ag(111) surface [J].

Casagrande, M ;

Lacombe, S ;

Guillemot, L ;

Esaulov, VA .

SURFACE SCIENCE, 2000, 445 (01) :L29-L35

[9] Quantification of the surface composition of low-work function surfaces using low-energy ion scattering [J].

Cortenraad, R ;

van der Gon, AWD ;

Brongersma, HH ;

Ermolov, SN ;

Glebovsky, VG .

SURFACE AND INTERFACE ANALYSIS, 2001, 31 (03) :200-205

[10] Crystal-face dependence of low-energy ion scattering signals [J].

Cortenraad, R ;

Ermolov, SN ;

Moest, B ;

van der Gon, AWD ;

Glebovsky, VG ;

Brongersma, HH .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 174 (1-2) :173-180