High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale

被引:92
作者
Thust, A. [1 ]
机构
[1] Forschungszentrum Julich, Inst Solid State Res, D-52425 Julich, Germany
关键词
CCD CAMERAS; IMAGE SIMULATION; NOISE TRANSFER; ABERRATIONS; SCATTERING; SIGNAL; HREM;
D O I
10.1103/PhysRevLett.102.220801
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A fully quantitative approach to high-resolution transmission electron microscopy requires a satisfactory match between image simulations and experiments. While almost perfect agreement between simulations and experiments is routinely achieved on a relative contrast level, a huge mutual discrepancy in the absolute image contrast by a factor of 3 has been frequently reported. It is shown that a major reason for this well-known contrast discrepancy, which is often called Stobbs-factor problem, lies in the neglect of the detector modulation-transfer function in image simulations.
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页数:4
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共 26 条
[1]   Quantification of the Information Limit of Transmission Electron Microscopes [J].
Barthel, J. ;
Thust, A. .
PHYSICAL REVIEW LETTERS, 2008, 101 (20)
[2]  
Boothroyd C.B., 1997, SCANNING MICROSCOPY, V11, P31
[3]   Quantification of high-resolution electron microscope images of amorphous carbon [J].
Boothroyd, CB .
ULTRAMICROSCOPY, 2000, 83 (3-4) :159-168
[4]   Why don't high-resolution simulations and images match? [J].
Boothroyd, CB .
JOURNAL OF MICROSCOPY, 1998, 190 :99-108
[5]   The contribution of phonon scattering to high-resolution images measured by off-axis electron holography [J].
Boothroyd, CB ;
Dunin-Borkowski, RE .
ULTRAMICROSCOPY, 2004, 98 (2-4) :115-133
[6]   The phonon contribution to high-resolution electron microscope images [J].
Boothroyd, CB ;
Yeadon, M .
ULTRAMICROSCOPY, 2003, 96 (3-4) :361-365
[7]   IMAGING PROPERTIES AND APPLICATIONS OF SLOW-SCAN CHARGE-COUPLED-DEVICE CAMERAS SUITABLE FOR ELECTRON-MICROSCOPY [J].
DERUIJTER, WJ .
MICRON, 1995, 26 (03) :247-275
[8]   Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs [J].
Du, K. ;
von Hochmeister, K. ;
Phillipp, F. .
ULTRAMICROSCOPY, 2007, 107 (4-5) :281-292
[9]  
HENDERSON R, 2008, P 14 EUR MICR C AACH, V1, P71
[10]   Hunting the Stobbs factor [J].
Howie, A .
ULTRAMICROSCOPY, 2004, 98 (2-4) :73-79