Low temperature scanning force microscopy of the Si(111)-(7 x 7) surface

被引：91

作者：

Lantz, MA

Hug, HJ

van Schendel, PJA

Hoffmann, R

Martin, S

Baratoff, A

Abdurixit, A

Güntherodt, HJ

Gerber, C

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

[2] IBM Corp, Div Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 12期

关键词：

D O I：

10.1103/PhysRevLett.84.2642

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A low temperature scanning force microscope (SFM) operating in a dynamic mode in ultrahigh vacuum was used to study the Si(111)-(7 X 7) surface at 7.2 K. Not only the twelve adatoms but also the six rest atoms of the unit cell are clearly resolved for the first time with SFM. In addition, the first measurements of the short range chemical bonding forces above specific atomic sites are presented. The data are in good agreement with first principles computations and indicate that the nearest atoms in the tip and sample relax significantly when the tip is within a few Angstrom of the surface.

引用

页码：2642 / 2645

页数：4

共 15 条

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