Quantitative theory for the imaging of conducting objects in electrostatic force microscopy

被引:26
作者
Sacha, G. M.
Gomez-Navarro, C.
Saenz, J. J.
Gomez-Herrero, J.
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Sci Mat, Berkeley, CA 94720 USA
[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain
[3] Univ Autonoma Madrid, Inst Nicolas Cabrera, E-28049 Madrid, Spain
关键词
D O I
10.1063/1.2364862
中图分类号
O59 [应用物理学];
学科分类号
摘要
A theoretical method for the imaging of metallic objects in electrostatic force microscopy is presented. The technique, based on the generalized image charge method, includes intrinsically the mutual polarization between the tip, the sample, and the metallic objects. Taking also into account the cantilever and macroscopic shape of the tip, the theory gives us a quantitative value for the electrostatic interaction between the tip and the objects over the surface. Experimental data of frequency shifts in an oscillating tip induced by grounded and isolated nanotubes are analyzed finding an excellent quantitative agreement between experimental data and numerical calculations. (c) 2006 American Institute of Physics.
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页数:3
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