Epitaxial growth of InN by plasma-assisted metalorganic chemical vapor deposition

被引:14
作者
Sato, M
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1997年 / 36卷 / 5B期
关键词
InN; plasma-assisted MOCVD; nitrogen radical; carrier gas effect; surface morphology; growth kinetics;
D O I
10.1143/JJAP.36.L595
中图分类号
O59 [应用物理学];
学科分类号
摘要
InN epitaxial films were grown on (0001) sapphire substrates by plasma-assisted metalorganic chemical vapor deposition, by which large amounts of radicals can be supplied to a surface with less ion damages; using triethylindium and nitrogen radicals as the precursors. When argon was used as a carrier gas, InN having a rough surface with a lot of indium droplets was grown. When hydrogen was used, the InN surface was specular and few droplets were found. InN was grown in hydrogen at a low temperature of 400 degrees C where no growth occurred in argon. These results suggest that the carrier gas influences the InN growth and that hydrogen enhances both the decomposition of organometallics and the removal of excess metal atoms at the growing surface.
引用
收藏
页码:L595 / L597
页数:3
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