On the physical understanding of the kT-layer concept in quasi-ballistic regime of transport in nanoscale devices

被引:30
作者
Clerc, Raphael [1 ]
Palestri, Pierpaolo
Selmi, Luca
机构
[1] Inst Microelect Electromagnetisme, Grenoble, France
[2] IMEP, Grenoble, France
[3] Univ Udine, DIEGM, I-33100 Udine, Italy
关键词
ballistic transport; Boltzmann-transport-equation; MOSFET; nanoscale transport;
D O I
10.1109/TED.2006.876387
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The aim of this paper is to establish a well-defined theoretical background in which the kT-layer concept and the empirical expression of the backscattering coefficient introduced by Lundstrom and co-workers to describe the role of scattering in nanoscale devices under high-field conditions and quasi-ballistic transport regime are derived analytically. To this purpose, one-dimensional (1-D) Boltzmann transport equation is solved in the framework of a "relaxation length" approximation, leading to a set of drift-diffusion like transport equations. This set of equations is then solved in a template 1-D structure (with a linear potential-energy profile), leading to an analytical expression for the backscattering coefficient, which is equal, in the limit of low- and high-electric fields, to the formulas proposed by Lundstrom et al. This approach allows us to identify the exact assumptions and qualitative validity limits of these formulas.
引用
收藏
页码:1634 / 1640
页数:7
相关论文
共 22 条
[1]   FORMULATION OF THE BOLTZMANN-EQUATION IN TERMS OF SCATTERING MATRICES [J].
ALAM, MA ;
STETTLER, MA ;
LUNDSTROM, MS .
SOLID-STATE ELECTRONICS, 1993, 36 (02) :263-271
[2]   The drift-diffusion equation revisited [J].
Assad, F ;
Banoo, K ;
Lundstrom, M .
SOLID-STATE ELECTRONICS, 1998, 42 (03) :283-295
[3]   BALLISTIC STRUCTURE IN THE ELECTRON-DISTRIBUTION FUNCTION OF SMALL SEMICONDUCTING STRUCTURES - GENERAL FEATURES AND SPECIFIC TRENDS [J].
BARANGER, HU ;
WILKINS, JW .
PHYSICAL REVIEW B, 1987, 36 (03) :1487-1502
[4]   BALLISTIC ELECTRONS IN AN INHOMOGENEOUS SUB-MICRON STRUCTURE - THERMAL AND CONTACT EFFECTS [J].
BARANGER, HU ;
WILKINS, JW .
PHYSICAL REVIEW B, 1984, 30 (12) :7349-7351
[5]  
Datta S., 1997, ELECT TRANSPORT MESO
[6]   Understanding quasi-ballistic transport in nano-MOSFETs: Part II - Technology scaling along the ITRS [J].
Eminente, S ;
Esseni, D ;
Palestri, P ;
Fiegna, C ;
Selmi, L ;
Sangiorgi, E .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (12) :2736-2743
[7]   Analytical model for quantization on strained and unstrained bulk nMOSFET and its impact on quasi-ballistic current [J].
Ferrier, M ;
Clerc, R ;
Ghibaudo, G ;
Boeuf, F ;
Skotnicki, T .
SOLID-STATE ELECTRONICS, 2006, 50 (01) :69-77
[8]   DIFFUSION IN A SHORT BASE [J].
GRINBERG, AA ;
LURYI, S .
SOLID-STATE ELECTRONICS, 1992, 35 (09) :1299-1309
[9]  
Lundstrom M, 2003, 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, P789
[10]   Essential physics of carrier transport in nanoscale MOSFETs [J].
Lundstrom, M ;
Ren, ZB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (01) :133-141