Scanning-tunneling-microscopy study of InP(001) surfaces prepared by UHV decapping of metal-organic vapor-phase-epitaxy-grown samples

被引:35
作者
Esser, N
ReschEsser, U
Pristovsek, M
Richter, W
机构
[1] Institut für Festkörperphysik, Technische Universität Berlin, D-10623 Berlin
来源
PHYSICAL REVIEW B | 1996年 / 53卷 / 20期
关键词
D O I
10.1103/PhysRevB.53.R13257
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study we report on an investigation of the microscopic structure of InP(001) surfaces grown by metal-organic vapor-phase epitaxy (MOVPE). InP(001) homoepitaxial layers were grown in a MOVPE reactor and capped in situ with a P/As sandwich layer by photodecomposition of the phosphine and arsine precursors in the gas phase. The passivated samples were transferred through atmosphere into a separate UHV system. After thermal desorption of the capping layers, a clear (2X4) LEED pattern was achieved. STM images show large, flat surface areas. Images with atomic resolution reveal a (2X4) surface structure corresponding to an In-rich surface. The microscopic surface structure is discussed in the light of recently proposed structure models.
引用
收藏
页码:13257 / 13259
页数:3
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