Ab initio models of amorphous InN

被引:12
作者
Cai, B. [1 ]
Drabold, D. A. [1 ,2 ]
机构
[1] Ohio Univ, Dept Phys & Astron, Athens, OH 45701 USA
[2] Univ Cambridge Trinity Coll, Cambridge CB2 1TQ, England
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 19期
基金
美国国家科学基金会;
关键词
ab initio calculations; amorphous semiconductors; bond angles; density functional theory; electronic structure; III-V semiconductors; indium compounds; vibrational modes; wide band gap semiconductors; BAND-GAP; FILMS;
D O I
10.1103/PhysRevB.79.195204
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we present the first structural model of amorphous indium nitride obtained from first-principles simulation. We created a small 64-atom model by quenching from the melt and analyzed a chemically ordered 250-atom model of Mousseau and Barkema. We find that both N and In atoms tend to be fourfold. Upon relaxation, we find no homopolar bonds in the small cell and only one in the 250-atom cell. The topology of the models is analyzed with pair-correlation functions, bond angle distributions, and ring statistics. The vibrational and electronic properties are also obtained. We found that density-functional methods in the local-density approximation predict a very small gap for amorphous InN, similar to the case for crystalline InN.
引用
收藏
页数:4
相关论文
共 20 条
[1]   InN, latest development and a review of the band-gap controversy [J].
Butcher, KSA ;
Tansley, TL .
SUPERLATTICES AND MICROSTRUCTURES, 2005, 38 (01) :1-37
[2]  
Davydov VY, 2002, PHYS STATUS SOLIDI B, V230, pR4, DOI 10.1002/1521-3951(200204)230:2<R4::AID-PSSB99994>3.0.CO
[3]  
2-Z
[4]   Reliability of measuring the roughness exponent in a small-length-scale regime [J].
Deng, J ;
Ye, F ;
Long, QY ;
Lung, CW .
PHYSICAL REVIEW B, 1999, 59 (01) :8-11
[5]   Topics in the theory of amorphous materials [J].
Drabold, D. A. .
EUROPEAN PHYSICAL JOURNAL B, 2009, 68 (01) :1-21
[6]  
Haddad D.B., 2004, MAT RES SOC S P, V798, pY12.7.1
[7]   Estimation of band-gap energy of intrinsic InN from photoluminescence properties of undoped and Si-doped InN films grown by plasma-assisted molecular-beam epitaxy [J].
Higashiwaki, M ;
Matsui, T .
JOURNAL OF CRYSTAL GROWTH, 2004, 269 (01) :162-166
[8]   Directional effects of heavy-ion irradiation in Tb/Fe multilayers [J].
Juraszek, J ;
Fnidiki, A ;
Teillet, J ;
Toulemonde, M ;
Michel, A ;
Keune, W .
PHYSICAL REVIEW B, 2000, 61 (01) :12-15
[9]   Optical absorption in amorphous InN thin films [J].
Khoshman, Jebreel M. ;
Kordesch, Martin E. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (52-54) :5572-5577
[10]  
KRESSE G, VASP GUIDE 2003