Dose and energy dependence of mechanical properties of focused electron-beam-induced pillar deposits from Cu(C5HF6O2)2

被引:26
作者
Friedli, V. [1 ]
Utke, I. [1 ]
Molhave, K. [2 ]
Michler, J. [1 ]
机构
[1] EMPA, Swiss Fed Labs Mat Testing & Res, Lab Mech Mat & Nanostruct, CH-3602 Thun, Switzerland
[2] Tech Univ Denmark, Dept Micro & Nanotechnol, DK-2800 Kongens Lyngby, Denmark
关键词
CHEMICAL-VAPOR-DEPOSITION; 3-DIMENSIONAL NANOSTRUCTURES; QUALITY FACTORS; YOUNGS MODULUS; MICROSCOPY; LOSSES; TIPS; FABRICATION; RESONANCE; STRENGTH;
D O I
10.1088/0957-4484/20/38/385304
中图分类号
TB3 [工程材料学];
学科分类号
082905 [生物质能源与材料];
摘要
Bending and vibration tests performed inside a scanning electron microscope were used to mechanically characterize high aspect pillars grown by focused electron-beam-(FEB) induced deposition from the precursor Cu(C5HF6O2)(2). Supported by finite element (FE) analysis the Young's modulus was determined from load-deflection measurements using cantilever-based force sensing and the material density from additional resonance vibration analysis. The pillar material consisted of a carbonaceous (C-, O-, F-, H-containing) matrix which embeds 5-10 at.% Cu deposited at 5 and 20 keV primary electron energy and 100 pA beam current, depending on primary electron energy. The Young's moduli of the FEB deposits increased from 17 +/- 6 to 25 +/- 8 GPa with increasing electron dose. The density of the carbonaceous matrix shows a dependence on the primary electron energy: 1.2 +/- 0.3 g cm(-3) (5 keV) and 2.2 +/- 0.5 g cm(-3) (20 keV). At a given primary energy a correlation with the irradiation dose is found. Quality factors determined from the phase relation at resonance of the fundamental pillar vibration mode were in the range of 150-600 and correlated to the deposited irradiation energy.
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页数:11
相关论文
共 69 条
[1]
NEW SCANNING TUNNELING MICROSCOPY TIP FOR MEASURING SURFACE-TOPOGRAPHY [J].
AKAMA, Y ;
NISHIMURA, E ;
SAKAI, A ;
MURAKAMI, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :429-433
[2]
Fabrication and actuation of customized nanotweezers with a 25 nm gap [J].
Boggild, P ;
Hansen, TM ;
Tanasa, C ;
Grey, F .
NANOTECHNOLOGY, 2001, 12 (03) :331-335
[3]
Characterization of focused electron beam induced carbon deposits from organic precursors [J].
Bret, T ;
Mauron, S ;
Utke, I ;
Hoffmann, P .
MICROELECTRONIC ENGINEERING, 2005, 78-79 :300-306
[4]
Thermal conductivity of amorphous carbon thin films [J].
Bullen, AJ ;
O'Hara, KE ;
Cahill, DG ;
Monteiro, O ;
von Keudell, A .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (11) :6317-6320
[5]
Strategies for the immobilization of nanoparticles using electron beam induced deposition [J].
Burbridge, Daniel J. ;
Crampin, Simon ;
Viau, Guillaume ;
Gordeev, Sergey N. .
NANOTECHNOLOGY, 2008, 19 (44)
[6]
Resonance of curved nanowires [J].
Calabri, L. ;
Pugno, N. ;
Ding, W. ;
Ruoff, R. S. .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2006, 18 (33) :S2175-S2183
[7]
Measurement of mechanical resonance and losses in nanometer scale silicon wires [J].
Carr, DW ;
Evoy, S ;
Sekaric, L ;
Craighead, HG ;
Parpia, JM .
APPLIED PHYSICS LETTERS, 1999, 75 (07) :920-922
[8]
Near field optical behaviour of C supertips [J].
Castagné, M ;
Benfedda, M ;
Lahimer, S ;
Falgayrettes, P ;
Fillard, JP .
ULTRAMICROSCOPY, 1999, 76 (04) :187-194
[9]
Elastic wave transmission at an abrupt junction in a thin plate with application to heat transport and vibrations in mesoscopic systems [J].
Cross, MC ;
Lifshitz, R .
PHYSICAL REVIEW B, 2001, 64 (08)
[10]
Mechanics of hydrogenated amorphous carbon deposits from electron-beam-induced deposition of a paraffin precursor [J].
Ding, W ;
Dikin, DA ;
Chen, X ;
Piner, RD ;
Ruoff, RS ;
Zussman, E ;
Wang, X ;
Li, X .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (01)