Current-induced magnetization switching in MgO barrier based magnetic tunnel junctions with CoFeB/Ru/CoFeB synthetic ferrimagnetic free layer

被引:125
作者
Hayakawa, Jun
Ikeda, Shoji
Lee, Young Min
Sasaki, Ryutaro
Meguro, Toshiyasu
Matsukura, Fumihiro
Takahashi, Hiromasa
Ohno, Hideo
机构
[1] Hitachi Ltd, Adv Res Lab, Kokubunji, Tokyo 1858601, Japan
[2] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Lab Nanoelect & Spintron, Sendai, Miyagi 9808577, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2006年 / 45卷 / 37-41期
关键词
current-induced magnetization switching; synthetic free layer; magnetic tunnel junction; MgO barrier; CoFeB;
D O I
10.1143/JJAP.45.L1057
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the intrinsic critical current density (J(c0)) in current-induced magnetization switching and the thermal stability factor (E/k(B)T, where E, k(B), and T are the energy potential, the Boltzmann constant, and temperature, respectively) in MgO based magnetic tunnel junctions with a Co40Fe40B20(2 nm)/Ru(0.7-2.4 nm)/Co40Fe40B20(2 nm) synthetic ferrimagnetic (SyF) free layer. We show that J(c0) and E/k(B)T can be determined by analyzing the average critical current density as a function of coercivity using the Slonczewski's model taking into account thermal fluctuation. We find that high antiferromagnetic coupling between the two CoFeB layers in a SyF free layer results in reduced J(c0) without reducing high E/k(B)T.
引用
收藏
页码:L1057 / L1060
页数:4
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