An approach to device grade amorphous and microcrystalline silicon thin films fabricated at higher deposition rates

被引:28
作者
Kondo, M [1 ]
Matsuda, A [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
关键词
amorphous silicon; microcrystalline silicon; plasma CVD; solar cells;
D O I
10.1016/S1359-0286(02)00113-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We demonstrate the recent developments in the high-rate deposition technique of thin film silicon using a novel approach of plasma enhanced chemical vapor deposition. Hydrogenated amorphous silicon has been developed for thin film solar cells in the past three decades, however the severe photodegradation of the film as well as of the devices prepared at a high deposition rate has hindered the industrialization of this material. The SiH2 Structure in the film has been identified as a cause of the photodegradation, and its formation mechanism has been clarified in terms of the electron temperature of the plasma, gaseous phase reactions and surface reactions. We found that the combination of a VHF plasma, proper hydrogen dilution and higher deposition temperature improves the efficiency of solar cells after photodegradation up to 8.2%, which is the highest efficiency under high deposition rate conditions. The high deposition rate technique for microcrystalline silicon has also been developed on the basis of the knowledge that a sufficiently high amount of atomic hydrogen and the reduction in the ion bombardment are the key factors for high quality microcrystalline silicon. A novel deposition technique under high-pressure depletion conditions has been developed in combination with a VHF plasma to obtain a deposition rate as high as 5 nm/s, and further development has been achieved by means of a hollow mesh so that a lot of migrating bright spot appear on the mesh to obtain a deposition rate of 5.8 nm/s with good crystallinity and a defect density as low as 2.6X 10(16) cm(-3), which implies a device grade material. A solar cell with an efficiency of 8.1% has been prepared at a deposition rate of 1.2 nm/s. (C) 2002 Published by Elsevier Science Ltd.
引用
收藏
页码:445 / 453
页数:9
相关论文
共 55 条
[1]   IN-SITU REAL-TIME STUDIES OF THE FORMATION OF POLYCRYSTALLINE SILICON FILMS ON GLASS GROWN BY A LAYER-BY-LAYER TECHNIQUE [J].
AKASAKA, T ;
SHIMIZU, I .
APPLIED PHYSICS LETTERS, 1995, 66 (25) :3441-3443
[2]   AMORPHOUS SILICON SOLAR-CELL [J].
CARLSON, DE ;
WRONSKI, CR .
APPLIED PHYSICS LETTERS, 1976, 28 (11) :671-673
[3]   Amorphous and microcrystalline silicon deposited by low-power electron-cyclotron resonance plasma-enhanced chemical-vapor deposition [J].
Conde, JP ;
Schotten, V ;
Arekat, S ;
Brogueira, P ;
Sousa, R ;
Chu, V .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (1A) :38-49
[4]   High growth-rate fabrication of micro-crystalline silicon by Helicon wave plasma CVD [J].
Endo, K ;
Isomura, M ;
Taguchi, M ;
Tarui, H ;
Kiyama, S .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 66 (1-4) :283-288
[5]   IMPROVEMENT OF GRAIN-SIZE AND DEPOSITION RATE OF MICROCRYSTALLINE SILICON BY USE OF VERY HIGH-FREQUENCY GLOW-DISCHARGE [J].
FINGER, F ;
HAPKE, P ;
LUYSBERG, M ;
CARIUS, R ;
WAGNER, H ;
SCHEIB, M .
APPLIED PHYSICS LETTERS, 1994, 65 (20) :2588-2590
[6]   ELECTRICAL-PROPERTIES AND DEGRADATION KINETICS OF COMPENSATED HYDROGENATED MICROCRYSTALLINE SILICON DEPOSITED BY VERY HIGH-FREQUENCY-GLOW DISCHARGE [J].
FLUCKIGER, R ;
MEIER, J ;
GOETZ, M ;
SHAH, A .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (02) :712-716
[7]   High rate growth of microcrystalline silicon using a high-pressure depletion method with VHF plasma [J].
Fukawa, M ;
Suzuki, S ;
Guo, LH ;
Kondo, M ;
Matsuda, A .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 66 (1-4) :217-223
[8]   DEFECT FORMATION DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON [J].
GANGULY, G ;
MATSUDA, A .
PHYSICAL REVIEW B, 1993, 47 (07) :3661-3670
[9]   High rate deposition of microcrystalline silicon using conventional plasma-enhanced chemical vapor deposition [J].
Guo, LH ;
Kondo, M ;
Fukawa, M ;
Saitoh, K ;
Matsuda, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (10A) :L1116-L1118
[10]   ELECTRICAL-PROPERTIES AND ELECTRON-SPIN-RESONANCE OF UNDOPED MICROCRYSTALLINE SI WITH A PREFERENTIAL ORIENTATION [J].
HASEGAWA, S ;
KISHI, K ;
KURATA, Y .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (02) :199-209