Critical diameter for III-V nanowires grown on lattice-mismatched substrates

被引:218
作者
Chuang, Linus C. [1 ]
Moewe, Michael
Chase, Chris
Kobayashi, Nobuhiko P.
Chang-Hasnain, Connie
Crankshaw, Shanna
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Appl Sci & Technol Grp, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2436655
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors report the experimental observation of a critical diameter (CD) of III-V compound semiconductor epitaxial nanowires (NWs) grown on lattice-mismatched substrates using Au-catalyzed vapor-liquid-solid growth. The CD is found to be inversely proportional to the lattice mismatch. NWs with well-aligned orientation are synthesized with catalysts smaller than the CD. Well-aligned InP NWs grown on a Si substrate exhibit a record low photoluminescence linewidth (5.1 meV) and a large blueshift (173 meV) from the InP band gap energy due to quantization. Well-aligned InAs NWs grown on a Si substrate are also demonstrated. (c) 2007 American Institute of Physics.
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页数:3
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