Photon-assisted tunneling in electron pumps

被引：49

作者：

Covington, M ^{[1
]}

Keller, MW ^{[1
]}

Kautz, RL ^{[1
]}

Martinis, JM ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80303 USA

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.84.5192

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We measure photon-assisted tunneling in 4- and 6-junction electron pumps at photon frequencies up to 60 GHz. We determine the microwave voltage at the pumps using noise thermometry. The standard theory of leakage in the electron pump, modified to include photon-assisted tunneling, describes our experiments well. From this test of theory we argue that, in the absence of external microwaves, photon-assisted tunneling driven by 1/f noise is an important error mechanism in electron pumps.

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收藏

页码：5192 / 5195

页数：4

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