Phase shifting holographic double exposure interferometry with fast photorefractive crystals

被引:17
作者
Dirksen, D
Matthes, F
Riehemann, S
vonBally, G
机构
[1] Laboratory of Biophysics, Institute of Experimental Audiology, University of Münster
关键词
D O I
10.1016/S0030-4018(96)00576-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A technique for quasi real-time holographic interferometry with reflection type objects is presented. It is based on fast sequences of holographic double exposure interferograms recorded in sillenite-type photorefractive BTO crystals. The application of the phase shifting method for automatic quantitative evaluation of the obtained interferograms under the special constraint of short storage times in fast photorefractive crystals is investigated. Approaches to overcome this difficulty by applying a time dependent external electric field are discussed. Experimental results for dynamic analysis of reflecting type objects are presented.
引用
收藏
页码:310 / 316
页数:7
相关论文
共 20 条
[1]  
Carre P., 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005
[2]  
Creath K., 1988, Progress in optics. Vol.XXVI, P349, DOI 10.1016/S0079-6638(08)70178-1
[3]   2-REFERENCE-BEAM HOLOGRAPHIC INTERFEROMETRY [J].
DANDLIKER, R ;
MAROM, E ;
MOTTIER, FM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (01) :23-30
[4]  
DEVRE R, 1995, J OPT SOC AM B, V12, P600, DOI 10.1364/JOSAB.12.000600
[5]   HOLOGRAPHIC DOUBLE-EXPOSURE INTERFEROMETRY IN NEAR REAL-TIME WITH PHOTOREFRACTIVE CRYSTALS [J].
DIRKSEN, D ;
VONBALLY, G .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1994, 11 (09) :1858-1864
[6]   Enhancement of holographic gratings by external electric fields in photorefractive BTVO crystals during reconstruction [J].
Dirksen, D ;
Rickermann, F ;
Riehemann, S ;
vonBally, G .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1996, 153 (02) :547-551
[7]  
DUBIELZIG J, 1993, SPIE, V1983, P585
[8]   PHASE-SHIFTING REAL-TIME HOLOGRAPHIC-INTERFEROMETRY THAT USES BISMUTH SILICON-OXIDE CRYSTALS [J].
GEORGES, MP ;
LEMAIRE, PC .
APPLIED OPTICS, 1995, 34 (32) :7497-7506
[9]   REAL-TIME DOUBLE-EXPOSURE INTERFEROMETRY WITH BI12SIO20 CRYSTALS IN TRANSVERSE ELECTROOPTIC CONFIGURATION [J].
HUIGNARD, JP ;
HERRIAU, JP .
APPLIED OPTICS, 1977, 16 (07) :1807-1809
[10]  
HUIGNARD JP, 1988, TOP APPL PHYS, V62, P205